Power supply di/dt measurement using on-chip di/dt detector circuit

被引：6

作者：

Nakura, T ^{[1
]}

Ikeda, M ^{[1
]}

Asada, K ^{[1
]}

机构：

[1] Univ Tokyo, Dept Elect Engn, VDEC, Tokyo 1138656, Japan

来源：

2004 SYMPOSIUM ON VLSI CIRCUITS, DIGEST OF TECHNICAL PAPERS | 2004年

关键词：

D O I：

10.1109/VLSIC.2004.1346519

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

This paper demonstrates an on-chip di/dt detector circuit. The di/dt detector circuit consists of a spiral inductor under the power supply line which induces a di/dt proportional voltage, and an amplifier which amplifies and outputs the value. The measurement results show that the di/dt detector output and the voltage difference between a resistor have good agreement. The di/dt detector also measures the de-coupling capacitor effects for the di/dt reduction.

引用

页码：106 / 109

页数：4

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