NEURAL NETWOK BASED X-RAY TOMOGRAPHY FOR FAST INSPECTION OF APPLES ON A CONVEYOR BELT SYSTEM

被引:0
|
作者
Janssens, Eline [1 ]
De Beenhouwer, Jan [1 ]
Van Dael, Mattias [2 ]
Verboven, Pieter [2 ]
Nicolai, Bart [2 ]
Sijbers, Jan [1 ]
机构
[1] Univ Antwerp CDE, iMinds, Vis Lab, Univ Pl 1, B-2610 Antwerp, Belgium
[2] Katholieke Univ Leuven, BIOSYST MeBios, B-3001 Heverlee, Belgium
关键词
Inline tomography; artificial neural networks; filtered backprojection; DISORDER;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The throughput of an inline computed tomography (CT) based inspection system depends on the speed of its image reconstruction algorithm. Filtered back projection (FBP) provides fast reconstructions, but requires many high quality radiographs from all angles to obtain accurate reconstructions. This is not achievable in an inline environment. Iterative reconstruction methods yield adequate reconstructions from limited, but they are slow. Recently a new reconstruction algorithm was introduced [1] that can handle limited data and is very fast: the neural network FBP (NN-FBP). In this work, we introduce a neural network (NN) based Hilbert transform FBP (NN-hFBP) for inline inspection. This method reconstructs images with a filter-based Hilbert transform FBP method. The filters are application specific and trained by a neural network. Comparison of the NN-hFBP and conventional reconstruction methods applied to inline fan-beam X-ray data of apples shows that the NN-hFBP yields high quality images in a short reconstruction time.
引用
收藏
页码:917 / 921
页数:5
相关论文
共 50 条
  • [21] Improved Inspection of Miniaturised Interconnections by Digital X-ray Inspection and Computed Tomography
    Roth, Holger
    Neubrand, Tobias
    Mayer, Thomas
    2010 12TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE (EPTC), 2010, : 441 - 444
  • [22] A PRIORITY SYSTEM FOR INSPECTION OF X-RAY FACILITIES
    DILLARD, BL
    HARDIN, CM
    RADIOLOGICAL HEALTH DATA AND REPORTS, 1970, 11 (08): : 367 - &
  • [23] Assessment of bruise volumes in apples using X-ray computed tomography
    Diels, Elien
    van Dael, Mattias
    Keresztes, Janos
    Vanmaercke, Simon
    Verboven, Pieter
    Nicolai, Bart
    Saeys, Wouter
    Ramon, Herman
    Smeets, Bart
    POSTHARVEST BIOLOGY AND TECHNOLOGY, 2017, 128 : 24 - 32
  • [24] Development of ultra-fast X-ray computed tomography scanner system
    Hori, K
    Fujimoto, T
    Kawanishi, K
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1998, 45 (04) : 2089 - 2094
  • [25] Development of ultra-fast X-ray computed tomography scanner system
    Mitsubitshi Heavy Industries, Ltd, Takasago, Japan
    IEEE Trans Nucl Sci, 4 pt 2 (2089-2094):
  • [26] Development of ultra-fast X-ray computed tomography scanner system
    Hori, K
    Fujimoto, T
    Kawanishi, K
    1997 IEEE NUCLEAR SCIENCE SYMPOSIUM - CONFERENCE RECORD, VOLS 1 & 2, 1998, : 1003 - 1008
  • [27] A FAST X-RAY COUNTING SYSTEM
    SHORT, MA
    BONNER, EJ
    STEPHENSON, KJ
    X-RAY SPECTROMETRY, 1993, 22 (01) : 58 - 60
  • [28] Fast X-Ray Luminescence Computed Tomography Imaging
    Liu, Xin
    Liao, Qimei
    Wang, Hongkai
    IEEE TRANSACTIONS ON BIOMEDICAL ENGINEERING, 2014, 61 (06) : 1621 - 1627
  • [29] Fast imaging method for grating-based x-ray computed tomography
    Xi, Yan
    Zhao, Jun
    DEVELOPMENTS IN X-RAY TOMOGRAPHY VIII, 2012, 8506
  • [30] Fiber based fast sparse sampling X-ray luminescence computed tomography
    Zhang, Wei
    Lun, Michael
    Li, Changqing
    MULTIMODAL BIOMEDICAL IMAGING XII, 2017, 10057