Guest Editorial: Special Issue on VLSI Design and Embedded Systems

被引：0
|
作者：
Panda, Preeti Ranjan [1 ]
Panda, Rajendran [2 ]
机构：
[1] Indian Inst Technol, Dept Comp Sci & Engn, New Delhi 110016, India
[2] Oracle Corp, Server Technol, Austin, TX USA
来源：
INTERNATIONAL JOURNAL OF PARALLEL PROGRAMMING | 2010年 / 38卷 / 3-4期
关键词：
VLSI Design; Design Space Exploration; Automatic Test Pattern Generation; System Level Design; Test Pattern Generation;
D O I：
10.1007/s10766-010-0133-6
中图分类号：
TP301 [理论、方法];
学科分类号：
081202 ;
摘要：
引用
收藏
页码：183 / 184
页数：2
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