Guest Editorial: Special Issue on VLSI Design and Embedded Systems

被引:0
|
作者
Panda, Preeti Ranjan [1 ]
Panda, Rajendran [2 ]
机构
[1] Indian Inst Technol, Dept Comp Sci & Engn, New Delhi 110016, India
[2] Oracle Corp, Server Technol, Austin, TX USA
关键词
VLSI Design; Design Space Exploration; Automatic Test Pattern Generation; System Level Design; Test Pattern Generation;
D O I
10.1007/s10766-010-0133-6
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
引用
收藏
页码:183 / 184
页数:2
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