X-ray line profile study on shot/laser-peened stainless steel

被引：6
|
作者：
Kumagai, Masayoshi [1 ]
Akita, Koichi [2 ]
Imafuku, Muneyuki [1 ]
Ohya, Shin-ichi [1 ]
机构：
[1] Tokyo City Univ, Dept Mech Syst Engn, Tokyo, Japan
[2] Japan Atom Energy Agcy, Quantum Beam Sci Directorate, Mikazuki, Hyogo 6795148, Japan
来源：
RESIDUAL STRESSES IX | 2014年 / 996卷
关键词：
Shot peening; Laser peening; X-ray diffraction; Line profile analysis; Dislocations; FATIGUE BEHAVIOR; GRAIN-SIZE; LASER; DIFFRACTION; DISLOCATIONS; SURFACE;
D O I：
10.4028/www.scientific.net/AMR.996.39
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
Microstructure and residual stress in AISI316 stainless steels processed via shot peening (SP) and laser peening (LP) were evaluated using X-ray line profile analysis and residual stress measurements. Although both specimens exhibited similar compressive residual stress profiles in the depth direction, the dislocation density in the SP specimen was greater than that in the LP specimen, while the crystallite size in the SP specimen was less than that of the LP specimen. Thus, the variation in the microstructural features in the samples subjected to the two processes differed.
引用
收藏
页码：39 / +
页数：2
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