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- [33] Effects of using a metal layer in total internal reflection fluorescence microscopy APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2007, 89 (02): : 333 - 335
- [35] Effects of using a metal layer in total internal reflection fluorescence microscopy Applied Physics A, 2007, 89 : 333 - 335
- [36] High-resolution soft X-ray spectrometry using the Electron-Multiplying Charge-Coupled Device (EM-CCD) UV, X-RAY, AND GAMMA-RAY SPACE INSTRUMENTATION FOR ASTRONOMY XVIII, 2013, 8859
- [39] AN ELECTRON SPECTROMETER USING A NEW MULTIDETECTOR SYSTEM BASED ON A CHARGE-COUPLED IMAGING DEVICE JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1980, 13 (07): : 713 - 715
- [40] SENSEI: Characterization of Single-Electron Events Using a Skipper Charge-Coupled Device PHYSICAL REVIEW APPLIED, 2022, 17 (01):