Large area flat crystal x-ray spectrometer with high integrated intensity for an electron beam ion trap

A flat crystal x-ray spectrometer has been constructed for spectroscopic studies of highly charged ions with an electron beam ion trap. It consists of a flat crystal and a position sensitive proportional counter. Employment of a flat crystal yields easy alignment, easy processing of the crystal, and high flexibility. The proportional counter has been designed to have a large effective area, which is needed to compensate for weak focusing power of a flat crystal. The utility of the new spectrometer has been demonstrated with the Tokyo electron beam ion trap. (C) 2000 American Institute of Physics. [S0034-6748(90)01212-6].