Large area flat crystal x-ray spectrometer with high integrated intensity for an electron beam ion trap

被引：17
|
作者：
Nakamura, N [1 ]
机构：
[1] JST, ICORP, Cold Trapped Ions Project, Tokyo 1820024, Japan
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2000年 / 71卷 / 11期
关键词：
D O I：
10.1063/1.1319978
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A flat crystal x-ray spectrometer has been constructed for spectroscopic studies of highly charged ions with an electron beam ion trap. It consists of a flat crystal and a position sensitive proportional counter. Employment of a flat crystal yields easy alignment, easy processing of the crystal, and high flexibility. The proportional counter has been designed to have a large effective area, which is needed to compensate for weak focusing power of a flat crystal. The utility of the new spectrometer has been demonstrated with the Tokyo electron beam ion trap. (C) 2000 American Institute of Physics. [S0034-6748(90)01212-6].
引用
收藏
页码：4065 / 4069
页数：5
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