An immune fault detection system for analog circuits with automatic detector generation

被引:0
|
作者
Amaral, Jorge L. M. [1 ]
Amaral, Jose F. M. [1 ]
Tanscheit, Ricardo [2 ]
机构
[1] Univ Fed Rio de Janeiro, Dept Elect & Telecommun, BR-20550013 Rio De Janeiro, Brazil
[2] Pontificia Univ Catolica Rio de Janeiro, Dept Elect Engn, 22453-900 Rio De Janeiro, RJ, Brazil
关键词
D O I
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中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
This work focuses on fault detection of electronic analog circuits. A fault detection system for analog circuits based on cross-correlation and artificial immune systems is proposed. It is capable of detecting faulty components in analog circuits by analyzing its impulse response. The use of cross-correlation for preprocessing the impulse response drastically reduces the size of the detector used by the Real-valued Negative Selection Algorithm (RNSA). The proposed method can automatically generate very efficient detectors by using quadtree decomposition. Results have demonstrated that the proposed system is able to detect faults in a Sallen-Key bandpass filter and in a continuous-time state variable filter.
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页码:2951 / +
页数:3
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