MoS2;
different metal gates and inverter;
CIRCUITS;
D O I:
10.1109/EDTM50988.2021.9420915
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
Various methods have been investigated to manipulate the electrical properties of MoS2 transistors to achieve applicable logic levels, which are essential for integrated multistage logic circuits. A doping-free strategy by using metal gates with different work functions is demonstrated to modulate threshold voltage (V-TH), which is critical for optimizing the matching levels of electrical properties. The optimized inverters show controllable inverter threshold voltages from 0.2 V to 0.6 V and the obtained voltage gain is over 35.
机构:
State Key Laboratory of Integrated Optoelectronics, Key Laboratory of Automobile Materials of MOE,College of Materials Science and Engineering, Jilin UniversityState Key Laboratory of Integrated Optoelectronics, Key Laboratory of Automobile Materials of MOE,College of Materials Science and Engineering, Jilin University
王啸宇
王雪
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机构:
State Key Laboratory of Integrated Optoelectronics, Key Laboratory of Automobile Materials of MOE,College of Materials Science and Engineering, Jilin UniversityState Key Laboratory of Integrated Optoelectronics, Key Laboratory of Automobile Materials of MOE,College of Materials Science and Engineering, Jilin University
王雪
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邹洪帅
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付钰豪
贺欣
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机构:
State Key Laboratory of Integrated Optoelectronics, Key Laboratory of Automobile Materials of MOE,College of Materials Science and Engineering, Jilin UniversityState Key Laboratory of Integrated Optoelectronics, Key Laboratory of Automobile Materials of MOE,College of Materials Science and Engineering, Jilin University
机构:
Elect & Telecommun Res Inst ETRI, Daejeon 34129, South KoreaElect & Telecommun Res Inst ETRI, Daejeon 34129, South Korea
Choi, Hong Kyw
Park, Jaesung
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机构:
Korea Res Inst Stand & Sci KRISS, Daejeon 305340, South KoreaElect & Telecommun Res Inst ETRI, Daejeon 34129, South Korea
Park, Jaesung
Gwon, Oh Hun
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机构:
Chungnam Natl Univ, Dept Phys, Daejeon 34134, South KoreaElect & Telecommun Res Inst ETRI, Daejeon 34129, South Korea
Gwon, Oh Hun
Kim, Jong Yun
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机构:
Chungnam Natl Univ, Inst Quantum Syst, Daejeon 34134, South KoreaElect & Telecommun Res Inst ETRI, Daejeon 34129, South Korea
Kim, Jong Yun
Kang, Seok-Ju
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Chungnam Natl Univ, Inst Quantum Syst, Daejeon 34134, South KoreaElect & Telecommun Res Inst ETRI, Daejeon 34129, South Korea
Kang, Seok-Ju
Byun, Hye Ryung
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Chungnam Natl Univ, Inst Quantum Syst, Daejeon 34134, South KoreaElect & Telecommun Res Inst ETRI, Daejeon 34129, South Korea
Byun, Hye Ryung
Shin, BeomKyu
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机构:
Chungnam Natl Univ, Dept Phys, Daejeon 34134, South KoreaElect & Telecommun Res Inst ETRI, Daejeon 34129, South Korea
Shin, BeomKyu
Jang, Seo Gyun
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机构:
Chungnam Natl Univ, Dept Phys, Daejeon 34134, South KoreaElect & Telecommun Res Inst ETRI, Daejeon 34129, South Korea
Jang, Seo Gyun
Kim, Han Seul
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机构:
Korea Inst Sci & Technol Informat KISTI, Natl Inst Supercomp & Networking, Ctr Supercomp Applicat, Daejeon 34141, South KoreaElect & Telecommun Res Inst ETRI, Daejeon 34129, South Korea
机构:
State Key Laboratory of ASIC and System, Shanghai Institute of Intelligent Electronics & Systems, School of Microelectronics, Fudan UniversityState Key Laboratory of ASIC and System, Shanghai Institute of Intelligent Electronics & Systems, School of Microelectronics, Fudan University
Yaochen Sheng
LuFang Zhang
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机构:
Engineering Research Center of IoT Technology Applications(Ministry of Education), Department of Electronic Engineering, Jiangnan UniversityState Key Laboratory of ASIC and System, Shanghai Institute of Intelligent Electronics & Systems, School of Microelectronics, Fudan University
LuFang Zhang
Feng Li
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机构:
New Energy Technology Engineering Laboratory of Jiangsu Province & School of Science, Nanjing University of Posts and TelecommunicationsState Key Laboratory of ASIC and System, Shanghai Institute of Intelligent Electronics & Systems, School of Microelectronics, Fudan University
Feng Li
Xinyu Chen
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机构:
State Key Laboratory of ASIC and System, Shanghai Institute of Intelligent Electronics & Systems, School of Microelectronics, Fudan UniversityState Key Laboratory of ASIC and System, Shanghai Institute of Intelligent Electronics & Systems, School of Microelectronics, Fudan University
Xinyu Chen
Zhijian Xie
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机构:
International Center for Quantum Materials, School of Physics, Peking UniversityState Key Laboratory of ASIC and System, Shanghai Institute of Intelligent Electronics & Systems, School of Microelectronics, Fudan University
Zhijian Xie
Haiyan Nan
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机构:
Engineering Research Center of IoT Technology Applications(Ministry of Education), Department of Electronic Engineering, Jiangnan UniversityState Key Laboratory of ASIC and System, Shanghai Institute of Intelligent Electronics & Systems, School of Microelectronics, Fudan University
Haiyan Nan
Zihan Xu
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机构:
Six Carbon Tech.ShenzhenState Key Laboratory of ASIC and System, Shanghai Institute of Intelligent Electronics & Systems, School of Microelectronics, Fudan University
Zihan Xu
David Wei Zhang
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机构:
State Key Laboratory of ASIC and System, Shanghai Institute of Intelligent Electronics & Systems, School of Microelectronics, Fudan UniversityState Key Laboratory of ASIC and System, Shanghai Institute of Intelligent Electronics & Systems, School of Microelectronics, Fudan University
David Wei Zhang
Jianhao Chen
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h-index: 0
机构:
International Center for Quantum Materials, School of Physics, Peking UniversityState Key Laboratory of ASIC and System, Shanghai Institute of Intelligent Electronics & Systems, School of Microelectronics, Fudan University
Jianhao Chen
Yong Pu
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机构:
New Energy Technology Engineering Laboratory of Jiangsu Province & School of Science, Nanjing University of Posts and TelecommunicationsState Key Laboratory of ASIC and System, Shanghai Institute of Intelligent Electronics & Systems, School of Microelectronics, Fudan University
Yong Pu
Shaoqing Xiao
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机构:
Engineering Research Center of IoT Technology Applications(Ministry of Education), Department of Electronic Engineering, Jiangnan UniversityState Key Laboratory of ASIC and System, Shanghai Institute of Intelligent Electronics & Systems, School of Microelectronics, Fudan University
Shaoqing Xiao
Wenzhong Bao
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机构:
State Key Laboratory of ASIC and System, Shanghai Institute of Intelligent Electronics & Systems, School of Microelectronics, Fudan UniversityState Key Laboratory of ASIC and System, Shanghai Institute of Intelligent Electronics & Systems, School of Microelectronics, Fudan University
机构:
Indian Inst Technol, Dept Mat & Met Engn, Kanpur 208016, Uttar Pradesh, India
Seoul Natl Univ, Sch Elect Engn & Comp Sci, Seoul 151744, South KoreaIndian Inst Technol, Dept Mat & Met Engn, Kanpur 208016, Uttar Pradesh, India
Gupta, Dipti
Hong, Yongtaek
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机构:
Seoul Natl Univ, Sch Elect Engn & Comp Sci, Seoul 151744, South KoreaIndian Inst Technol, Dept Mat & Met Engn, Kanpur 208016, Uttar Pradesh, India
机构:
Rutgers State Univ, Mat Sci & Engn, Piscataway, NJ 08854 USA
Rutgers State Univ, Elect & Comp Engn, Piscataway, NJ 08854 USARutgers State Univ, Mat Sci & Engn, Piscataway, NJ 08854 USA
Chhowalla, Manish
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Jena, Debdeep
Zhang, Hua
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机构:
Nanyang Technol Univ, Sch Mat Sci & Engn, Nanyang Ave, Singapore 639798, SingaporeRutgers State Univ, Mat Sci & Engn, Piscataway, NJ 08854 USA