Dielectric distributed Bragg reflectors;
Resonant cavity organic light emitting diode;
Full width at half maximum;
EFFICIENCY;
EMISSION;
LEDS;
D O I:
10.1016/j.optcom.2009.12.042
中图分类号:
O43 [光学];
学科分类号:
070207 ;
0803 ;
摘要:
In this article, we report on the effect of SiO2/Si3N4 dielectric distributed Bragg reflectors (DDBRs) for Alq(3)/NPB thin-film resonant cavity organic light emitting diode (RCOLED) in increasing the light output intensity and reducing the linewidth of spontaneous emission spectrum. The optimum DDBR number is found as 3 pairs. The device performance will be bad by further increasing or decreasing the number of DDBR. As compared to the conventional Alq(3)/NPB thin-film organic light emitting diode (OLED), the Alq(3)/NPB thin-film RCOLED with 3-pair DDBRs has the superior electrical and optical characteristics including a forward voltage of 6 V, a current efficiency of 3.4 cd/A, a luminance of 2715 cd/m(2) under the injection current density of 1000 A/m(2), and a full width at half maximum (FWHM) of 12 nm for emission spectrum over the 5-9 V bias range. These results represent that the Alq(3)/NPB thin-film OLED with DDBRs shows a potential as the light Source for plastic optical fiber (POF) communication system. Crown Copyright (C) 2010 Published by Elsevier B.V. All rights reserved.
机构:
Shijiazhuang Univ Econ, Inst Mat Sci & Engn, Shijiazhuang 050031, Peoples R ChinaShijiazhuang Univ Econ, Inst Mat Sci & Engn, Shijiazhuang 050031, Peoples R China
Du, Hongli
Li, Yan
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机构:
Shijiazhuang Univ Econ, Inst Mat Sci & Engn, Shijiazhuang 050031, Peoples R ChinaShijiazhuang Univ Econ, Inst Mat Sci & Engn, Shijiazhuang 050031, Peoples R China
Li, Yan
Cao, Chuanbao
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机构:
Beijing Inst Technol, Res Ctr Mat Sci, Beijing 100081, Peoples R ChinaShijiazhuang Univ Econ, Inst Mat Sci & Engn, Shijiazhuang 050031, Peoples R China
机构:
Sungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 440746, South KoreaSungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 440746, South Korea
Park, Jin Woo
Lim, Jong Tae
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机构:
Sungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 440746, South KoreaSungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 440746, South Korea
Lim, Jong Tae
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h-index:
机构:
Oh, Jong Sik
Kim, Sung Hee
论文数: 0引用数: 0
h-index: 0
机构:
Sungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 440746, South KoreaSungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 440746, South Korea
Kim, Sung Hee
Phuong Pham Viet
论文数: 0引用数: 0
h-index: 0
机构:
Sungkyunkwan Univ, SKKU Adv Inst Nano Technol SAINT, Suwon 440746, South KoreaSungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 440746, South Korea
Phuong Pham Viet
Jhon, Myung S.
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机构:
Carnegie Mellon Univ, Dept Chem Engn, Pittsburgh, PA 15213 USA
Carnegie Mellon Univ, Ctr Data Storage Syst, Pittsburgh, PA 15213 USASungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 440746, South Korea
Jhon, Myung S.
Yeom, Geun Young
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机构:
Sungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 440746, South Korea
Sungkyunkwan Univ, SKKU Adv Inst Nano Technol SAINT, Suwon 440746, South KoreaSungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 440746, South Korea
Yeom, Geun Young
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A,
2013,
31
(03):