Nanometer-scale probing of diffuse double layer forces at the electrode-electrolyte interface using the atomic force microscope.

被引：0
|
作者：
Hillier, AC
Bard, AJ
机构：
[1] Univ Virginia, Dept Chem Engn, Charlottesville, VA 22903 USA
[2] Univ Texas, Dept Chem, Austin, TX 78712 USA
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 1998年 / 215卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
262-COLL
引用
收藏
页码：U479 / U479
页数：1
相关论文
共 50 条
  • [41] Understanding the Electric Double Layer at the Electrode-Electrolyte Interface: Part I - No Ion Specific Adsorption
    Mazur, Daria A.
    Brandyshev, Petr E.
    Doronin, Sergey V.
    Budkov, Yury A.
    CHEMPHYSCHEM, 2024,
  • [42] Nanometer-scale lithography on Si(001) using adsorbed H as an atomic layer resist
    Journal of Vacuum Science & Technology B: Microelectronics Processing and Phenomena, 1996, 14 (03):
  • [43] An AlGaAs/GaAs tunnel diode integrated with nanometer-scale atomic force microscope tip-induced oxides
    Okada, Y
    Iuchi, Y
    Kawabe, M
    Harris, JS
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1999, 38 (2B): : L160 - L162
  • [44] Nanometer-scale lithography on Si(001) using adsorbed H as an atomic layer resist
    Adams, DP
    Mayer, TM
    Swartzentruber, BS
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (03): : 1642 - 1649
  • [45] Atomic force microscope force spectroscopy study of the electric double layer at a liquid crystal interface
    Skarabot, M.
    Musevic, I.
    JOURNAL OF APPLIED PHYSICS, 2009, 105 (01)
  • [46] Measurement of dynamical forces between deformable drops using the atomic force microscope. I. Theory
    Carnie, SL
    Chan, DYC
    Lewis, C
    Manica, R
    Dagastine, RR
    LANGMUIR, 2005, 21 (07) : 2912 - 2922
  • [47] NANOMETER SCALE IMAGING OF COBALT SILICIDE IN AIR USING ATOMIC FORCE MICROSCOPE AND SCANNING TUNNELING MICROSCOPE
    HEGDE, RI
    TOBIN, PJ
    SURFACE SCIENCE, 1992, 261 (1-3) : 1 - 6
  • [48] Measurement of mechanical properties of nanometer scale polymer structures using atomic force microscope
    Kim, Sung-Kyoung
    Shin, Min Kyoon
    Kim, Seon Jeong
    Lee, Haiwon
    IEEE NMDC 2006: IEEE NANOTECHNOLOGY MATERIALS AND DEVICES CONFERENCE 2006, PROCEEDINGS, 2006, : 374 - +
  • [49] Measuring energies at the nanometer-scale of molecular organic materials with an atomic force microscope: TTF-TCNQ as a case study
    J. Fraxedas
    J. Langer
    I. Díez
    F. Sanz
    Journal of Low Temperature Physics, 2006, 142 : 121 - 126
  • [50] Nanometer-scale patterning of oxygen molecules adsorbed on TiO2 surface by an atomic force microscope with a conductive cantilever
    Kobayashi, K
    Tomita, Y
    Yoshida, S
    NANO LETTERS, 2002, 2 (09) : 925 - 927
12345