Nanometer-scale probing of diffuse double layer forces at the electrode-electrolyte interface using the atomic force microscope.

被引：0
|
作者：
Hillier, AC
Bard, AJ
机构：
[1] Univ Virginia, Dept Chem Engn, Charlottesville, VA 22903 USA
[2] Univ Texas, Dept Chem, Austin, TX 78712 USA
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 1998年 / 215卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
262-COLL
引用
收藏
页码：U479 / U479
页数：1
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