A stitching figure profiler of large X-ray mirrors using RADSI for subaperture data acquisition

被引:29
|
作者
Kimura, Takashi [1 ]
Ohashi, Haruhiko [2 ]
Mimura, Hidekazu [1 ]
Yamakawa, Daisuke [1 ]
Yumoto, Hirokatsu [2 ]
Matsuyama, Satoshi [1 ]
Tsumura, Takashi [3 ]
Okada, Hiromi [3 ]
Masunaga, Tatsuhiko [3 ]
Senba, Yasunori [2 ]
Goto, Shunji [2 ]
Ishikawa, Tetsuya [2 ,4 ]
Yamauchi, Kazuto [1 ,5 ]
机构
[1] Osaka Univ, Grad Sch Engn, Dept Precis Sci & Technol, Suita, Osaka 5650871, Japan
[2] SPring 8 Japan Synchrotron Radiat Res Inst, Sayo, Hyogo 6795198, Japan
[3] JTEC Corp, Chuo Ku, Kobe, Hyogo 6500047, Japan
[4] SPring 8 RIKEN, Sayo, Hyogo 6795198, Japan
[5] Osaka Univ, Grad Sch Engn, Ctr Ultra Precis Sci & Technol, Suita, Osaka 5650871, Japan
关键词
X-ray focusing; X-ray mirror; Interferometric measurement; MSI; RADSI; SPATIAL-RESOLUTION; MICROSCOPY;
D O I
10.1016/j.nima.2009.11.014
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
In the third- and coming fourth-generation synchrotron radiation facilities, X-rays having both high brightness and high coherency can be utilized. Such X-rays require high accuracy in the reflective optics. In this study, we developed an ultra-precise measurement instrumentation for tangentially long X-ray mirrors using a Fizeau interferometer. In the system, the mirror figure is measured by stitching the subaperture profiles measured by the relative-angle determinable stitching interferometry, which we developed previously. High measurement accuracy of approximately 2 nm (peak to valley) was achieved in the measurement of a 400 mm-long aspherical surface. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:229 / 232
页数:4
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