On-chip real-time power supply noise detector

被引：0

作者：

Sehgal, Anuja ^{[1
]}

Song, Peilin ^{[1
]}

Jenkins, Keith A. ^{[1
]}

机构：

[1] IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA

来源：

ESSCIRC 2006: PROCEEDINGS OF THE 32ND EUROPEAN SOLID-STATE CIRCUITS CONFERENCE | 2006年

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

A new on-chip real-time noise detector that can be used for detecting voltage surges and droops on the internal power supply of VSLI circuits is presented. The noise detector is compact, and has the ability of detecting dc levels and high frequency on-chip transients of the power supply voltage. The detector has been implemented in a 90 nm CMOS technology, and has an area of 50x100 mu m(2). The measured results show that the detector can detect overshoots and undershoots of less than 1 ns, and as small as 20 mV.

引用

页码：380 / +

页数：2

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