ISTFA'97 brings testing, failure analysis of microelectronics to Silicon Valley

被引：0
|
作者：
Khandekar, C [1 ]
机构：
[1] Level One Commun Inc, Reliabil Assurance & Failure Anal, Sacramento, CA 95827 USA
来源：
ADVANCED MATERIALS & PROCESSES | 1997年 / 152卷 / 02期
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
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页码：34 / 34
页数：1
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