ISTFA'97 brings testing, failure analysis of microelectronics to Silicon Valley

被引：0

|

作者：

Khandekar, C ^{[1
]}

机构：

[1] Level One Commun Inc, Reliabil Assurance & Failure Anal, Sacramento, CA 95827 USA

来源：

ADVANCED MATERIALS & PROCESSES | 1997年 / 152卷 / 02期

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中图分类号：

T [工业技术];

学科分类号：

08 ;

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页码：34 / 34

页数：1

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