Ballistic-electron-emission microscopy (BEEM) studies of GaInP/GaAs heterostructures

被引：0
|
作者：
OShea, JJ [1 ]
Reaves, CM [1 ]
Chin, MA [1 ]
Denbaars, SP [1 ]
Gossard, AC [1 ]
Narayanamurti, V [1 ]
Jones, ED [1 ]
机构：
[1] UNIV CALIF SANTA BARBARA, DEPT MAT, SANTA BARBARA, CA 93106 USA
来源：
OPTOELECTRONIC MATERIALS: ORDERING, COMPOSITION MODULATION, AND SELF-ASSEMBLED STRUCTURES | 1996年 / 417卷
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D O I：
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中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
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页码：79 / 83
页数：5
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