Ballistic-electron-emission microscopy (BEEM) studies of GaInP/GaAs heterostructures

被引：0
|
作者：
OShea, JJ [1 ]
Reaves, CM [1 ]
Chin, MA [1 ]
Denbaars, SP [1 ]
Gossard, AC [1 ]
Narayanamurti, V [1 ]
Jones, ED [1 ]
机构：
[1] UNIV CALIF SANTA BARBARA, DEPT MAT, SANTA BARBARA, CA 93106 USA
来源：
OPTOELECTRONIC MATERIALS: ORDERING, COMPOSITION MODULATION, AND SELF-ASSEMBLED STRUCTURES | 1996年 / 417卷
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：79 / 83
页数：5
相关论文
共 50 条
  • [1] Conduction band offsets in ordered-GaInP/GaAs heterostructures studied by ballistic-electron-emission microscopy
    OShea, JJ
    Reaves, CM
    DenBaars, SP
    Chin, MA
    Narayanamurti, V
    APPLIED PHYSICS LETTERS, 1996, 69 (20) : 3022 - 3024
  • [2] Ballistic-electron-emission microscopy of semiconductor heterostructures
    Bell, LD
    Narayanamurti, V
    CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE, 1998, 3 (01): : 38 - 44
  • [3] BALLISTIC-ELECTRON-EMISSION MICROSCOPY OF ELECTRON-TRANSPORT THROUGH ALAS/GAAS HETEROSTRUCTURES
    KAISER, WJ
    HECHT, MH
    BELL, LD
    GRUNTHANER, FJ
    LIU, JK
    DAVIS, LC
    PHYSICAL REVIEW B, 1993, 48 (24): : 18324 - 18327
  • [4] BALLISTIC-ELECTRON-EMISSION MICROSCOPY (BEEM) - STUDIES OF METAL-SEMICONDUCTOR INTERFACES WITH NANOMETER RESOLUTION
    PRIETSCH, M
    PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS, 1995, 253 (04): : 164 - 233
  • [5] Theory of ballistic-electron-emission microscopy of buried semiconductor heterostructures
    Smith, DL
    Kogan, SM
    PHYSICAL REVIEW B, 1996, 54 (15) : 10354 - 10357
  • [6] Ballistic Electron Emission Microscopy (BEEM) of novel semiconductor heterostructures and quantum dots
    Narayanamurti, V
    PHOTODETECTORS: MATERIALS AND DEVICES III, 1998, 3287 : 152 - 166
  • [7] DIFFUSIVE AND INELASTIC-SCATTERING IN BALLISTIC-ELECTRON-EMISSION SPECTROSCOPY AND BALLISTIC-ELECTRON-EMISSION MICROSCOPY
    LEE, EY
    TURNER, BR
    SCHOWALTER, LJ
    JIMENEZ, JR
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1993, 11 (04): : 1579 - 1583
  • [8] Ballistic electron emission microscopy (BEEM) and spectroscopy of buried semiconductor heterostructures and quantum dots
    Narayanamurti, V
    SCIENCE REPORTS OF THE RESEARCH INSTITUTES TOHOKU UNIVERSITY SERIES A-PHYSICS CHEMISTRY AND METALLURGY, 1997, 44 (02): : 165 - 172
  • [9] Ballistic-electron-emission microscopy on epitaxial silicides
    Von Kanel, Hans
    Meyer, Thomas
    Klemenc, Michaela
    Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers, 1998, 37 (6 B): : 3800 - 3804
  • [10] A BALLISTIC-ELECTRON-EMISSION MICROSCOPY (BEEM) STUDY OF THE BARRIER HEIGHT CHANGE OF AU/N-GAAS SCHOTTKY CONTACTS DUE TO MECHANICAL POLISHING
    EVERAERT, JL
    VANMEIRHAEGHE, RL
    LAFLERE, WH
    CARDON, F
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1995, 10 (04) : 504 - 508
12345