Record fT and fT+ fMAX performance of InP/InGaAs single heterojunction bipolar transistors

被引:11
|
作者
Hafez, W [1 ]
Lai, JW [1 ]
Feng, M [1 ]
机构
[1] Univ Illinois, Dept Elect & Comp Engn, Urbana, IL 61801 USA
关键词
D O I
10.1049/el:20030534
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Record performance is reported for InP/InGaAs single heterojunction transistors. An f(T) of 382 GHz is reported on a 0.5 x 12 mum device, the highest for any bipolar device on any material system. Record f(T) + f(MAX) of 673 GHz was achieved on a 0.35 x 8 mum device.
引用
收藏
页码:811 / 813
页数:3
相关论文
共 50 条
  • [41] Type-II GaAsSb/InP DHBTs with record fT=670 GHz and simultaneous fT, fMAX > 400 GHz
    Snodgrass, William
    Wu, Bing-Ruey
    Cheng, K. Y.
    Feng, Milton
    2007 IEEE INTERNATIONAL ELECTRON DEVICES MEETING, VOLS 1 AND 2, 2007, : 663 - 666
  • [42] GaN/InGaN Heterojunction Bipolar Transistors With fT > 5 GHz
    Shen, Shyh-Chiang
    Dupuis, Russell D.
    Lee, Yi-Che
    Kim, Hee-Jin
    Zhang, Yun
    Lochner, Zachary
    Yoder, P. Douglas
    Ryou, Jae-Hyun
    IEEE ELECTRON DEVICE LETTERS, 2011, 32 (08) : 1065 - 1067
  • [43] Degradation of DC characteristics of InGaAs/InP single heterojunction bipolar transistors under electron irradiation
    Bandyopadhyay, A
    Subramanian, S
    Chandrasekhar, S
    Dentai, AG
    Goodnick, SM
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1999, 46 (05) : 840 - 849
  • [44] Degradation of InGaAs InP single heterojunction bipolar transistors under high energy electron irradiation
    Bandyopadhyay, A
    Subramanian, S
    Chandrasekhar, S
    Dentai, A
    Goodnick, SM
    MICROELECTRONICS RELIABILITY, 1999, 39 (03) : 333 - 339
  • [45] Low-frequency noise of InP/InGaAs heterojunction bipolar transistors
    Takanashi, Y
    Fukano, H
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1998, 45 (12) : 2400 - 2406
  • [46] INP/INGAAS DOUBLE HETEROJUNCTION BIPOLAR-TRANSISTORS GROWN ON SI
    MAKIMOTO, T
    KURISHIMA, K
    KOBAYASHI, T
    ISHIBASHI, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1991, 30 (12B): : 3815 - 3817
  • [47] Influence of spacer layer on InP/InGaAs δ-doped heterojunction bipolar transistors
    Tsai, JH
    Chu, YJ
    MATERIALS CHEMISTRY AND PHYSICS, 2005, 91 (2-3) : 431 - 436
  • [48] Simulation of electrical properties of InP/InGaAs heterojunction bipolar transistors in microwave
    Berrichi, Yamina
    Ghaffour, Kheireddine
    DIELECTRIC MATERIALS AND APPLICATIONS, ISYDMA '2016, 2016, 1 : 67 - 70
  • [49] Microwave noise in InP/InGaAs and GaAs/AlGaAs heterojunction bipolar transistors
    Sakalas, P
    Garcia, M
    Zirath, H
    Willander, M
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2001, 16 (01) : 14 - 20
  • [50] HIGH-SPEED INP/INGAAS HETEROJUNCTION BIPOLAR-TRANSISTORS
    CHAU, HF
    BEAM, EA
    IEEE ELECTRON DEVICE LETTERS, 1993, 14 (08) : 388 - 390