Femtosecond laser damage of all-dielectric pulse compression gratings

被引：6

作者：

Kong, Fanyu ^{[1
,2
]}

Chen, Shunli ^{[1
,2
]}

Liu, Xiaofeng ^{[1
]}

He, Kai ^{[1
,2
]}

Jin, Yunxia ^{[1
]}

Liu, Shijie ^{[1
]}

Guan, Heyuan ^{[1
,2
]}

Du, Ying ^{[1
,2
]}

He, Hongbo ^{[1
]}

机构：

[1] Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Key Lab Mat High Power Laser, Shanghai 201800, Peoples R China

[2] Univ Chinese Acad Sci, Beijing 100049, Peoples R China

来源：

LASER PHYSICS | 2014年 / 24卷 / 10期

基金：

国家高技术研究发展计划(863计划);

关键词：

diffraction gratings; femtosecond phenomena; laser-induced breakdown; average electric field; HIGH-EFFICIENCY; BROAD-BAND; THRESHOLD;

D O I：

10.1088/1054-660X/24/10/106101

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Damage tests of the ultrashort pulse compression gratings were implemented by an 800 nm laser with a pulse width of 40-100 fs. The damaged character of grating ridges demonstrates that laser damage of gratings is closely related to total deposited energy in grating ridges. The average electric field strength in grating ridges is naturally proposed to calculate the theoretical threshold based on the electron production model via photoionization and avalanche ionization, which makes theoretical and experimental results consistent. The results indicate that laser damage resistance of a grating can be evaluated by the average electric field in grating ridges.

引用

页数：5

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