Dislocation structure in coarse-grained copper after ion implantation

被引:0
|
作者
Sharkeev, YP [1 ]
Girsova, NV [1 ]
Ryabchikov, AI [1 ]
Kozlov, EV [1 ]
Perevalova, OB [1 ]
Brown, IG [1 ]
Yao, XY [1 ]
机构
[1] RUSSIAN ACAD SCI,INST STRENGTH PHYS & MAT SCI,TOMSK 634048,RUSSIA
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TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:532 / 537
页数:6
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