Impact of Heat Dissipation Profiles on Power Electronics Packaging Design

被引:0
|
作者
Wu, Tong [1 ]
Ozpineci, Burak [1 ,2 ]
机构
[1] Univ Tennessee, Bredesen Ctr, Knoxville, TN 37996 USA
[2] Oak Ridge Natl Lab, Power Elect & Elect Machinery Res Ctr, Knoxville, TN 37932 USA
关键词
Thermal management; Junction temperature; TEC; Modeling; Thermal coupling;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper focuses on understanding the thermal impacts of using discrete power devices and limitations of applying conventional thermal design methods. Empirically, a thermal system is designed based on selecting a heat sink with the required thermal resistance from the manufacturer datasheet. This method, as an approximate estimation, has been proven effective as a rough design of Si-based power module. However, wide bandgap (WBG) bare dies bring additional thermal design concerns that have been overlooked. The benefits of WBG devices, such as smaller chip sizes and higher power ratings, on the other hand, lead to thermal concentration issues. Detailed analyses and impacts of the thermal concentration are presented in this paper. A more accurate model involving Finite Element Analysis (FEA) and Genetic Algorithm Optimization is also proposed for a more accurate thermal design.
引用
收藏
页码:482 / 487
页数:6
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