Impact of Heat Dissipation Profiles on Power Electronics Packaging Design

被引:0
|
作者
Wu, Tong [1 ]
Ozpineci, Burak [1 ,2 ]
机构
[1] Univ Tennessee, Bredesen Ctr, Knoxville, TN 37996 USA
[2] Oak Ridge Natl Lab, Power Elect & Elect Machinery Res Ctr, Knoxville, TN 37932 USA
关键词
Thermal management; Junction temperature; TEC; Modeling; Thermal coupling;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper focuses on understanding the thermal impacts of using discrete power devices and limitations of applying conventional thermal design methods. Empirically, a thermal system is designed based on selecting a heat sink with the required thermal resistance from the manufacturer datasheet. This method, as an approximate estimation, has been proven effective as a rough design of Si-based power module. However, wide bandgap (WBG) bare dies bring additional thermal design concerns that have been overlooked. The benefits of WBG devices, such as smaller chip sizes and higher power ratings, on the other hand, lead to thermal concentration issues. Detailed analyses and impacts of the thermal concentration are presented in this paper. A more accurate model involving Finite Element Analysis (FEA) and Genetic Algorithm Optimization is also proposed for a more accurate thermal design.
引用
收藏
页码:482 / 487
页数:6
相关论文
共 50 条
  • [1] Heat Dissipation in GaN Based Power Electronics
    Su, Zonghui
    Malen, Jonathan A.
    GALLIUM NITRIDE AND SILICON CARBIDE POWER TECHNOLOGIES 3, 2013, 58 (04): : 343 - 349
  • [2] Design and characteristics of thermoelectric and liquid cooling composite active heat dissipation of power electronics
    Ben Tian
    Wang, Xinyuan
    Chen, Deyi
    Xu, Jianming
    Guan, Quanxue
    Mou, Yun
    2024 25TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY, ICEPT, 2024,
  • [3] Power Electronics Packaging Materials for High Heat Reliability
    Hozoji H.
    Kato F.
    Tanaka S.
    Shinkai J.
    Sato H.
    Journal of Japan Institute of Electronics Packaging, 2021, 24 (03) : 233 - 240
  • [4] The effects of material properties on heat dissipation in high power electronics
    Lu, TJ
    Evans, AG
    Hutchinson, JW
    JOURNAL OF ELECTRONIC PACKAGING, 1998, 120 (03) : 280 - 289
  • [5] Power electronics packaging
    Suganuma, Katsuaki
    Song, Jenn-Ming
    Lai, Yi-Shao
    MICROELECTRONICS RELIABILITY, 2015, 55 (12) : 2523 - 2523
  • [6] An overview to integrated power module design for high power electronics packaging
    Lostetter, AB
    Barlow, F
    Elshabini, A
    MICROELECTRONICS RELIABILITY, 2000, 40 (03) : 365 - 379
  • [7] Overview to integrated power module design for high power electronics packaging
    Lostetter, A.B.
    Barlow, F.
    Elshabini, A.
    2000, Elsevier Science Ltd, Exeter, United Kingdom (40)
  • [8] Thermal Effect of PMUT and Its Application to the Heat Dissipation of Power Electronics
    Li, Nan
    Chiu, Yihsiang
    Gong, Dan
    Ma, Shenglin
    Sun, Yunheng
    Li, Tingyu
    Lee, Hungping
    Liu, Huguang
    Jin, Yufeng
    2019 14TH ANNUAL IEEE INTERNATIONAL CONFERENCE ON NANO/MICRO ENGINEERED AND MOLECULAR SYSTEMS (IEEE-NEMS 2019), 2019, : 540 - 544
  • [9] Overview of the DoD needs for power electronics and power electronics packaging
    Electronics Manufacturing, Productivity Facility, Indiannapolis, United States
    Adv Microelectron, 1 (17-19):