Evolution of structure and magnetic properties of sputter-deposited CoPt thin films on MgO(111) substrates: Formation of the L11 phase

被引：71

作者：

Sun, An-Cheng ^{[1
,2
]}

Yuan, Fu-Te ^{[3
]}

Hsu, Jen-Hwa ^{[1
,2
]}

Lee, H. Y. ^{[4
]}

机构：

[1] Natl Taiwan Univ, Dept Phys, Taipei 106, Taiwan

[2] Natl Taiwan Univ, Ctr Nanostorage Res, Taipei 106, Taiwan

[3] Acad Sinica, Inst Phys, Taipei 11529, Taiwan

[4] NSRRC, Hsinchu 300, Taiwan

来源：

SCRIPTA MATERIALIA | 2009年 / 61卷 / 07期

关键词：

Ordering; X-ray diffraction (XRD); Crystal structure; Magnetic recording thin films; CoPt L1(1) phase; CRYSTAL-STRUCTURE; ANISOTROPY; ALLOY; ORDER;

D O I：

10.1016/j.scriptamat.2009.06.011

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

CoPt thin films with a thickness of 50 nm were deposited on MgO(111) substrates by magnetron-sputtering at temperatures ranging from room temperature to 750 degrees C. A unique phase evolution of A] (disordered) -> L1(1) -> Al -> L1(0) was clearly identified by performing theta-2 theta scans at different psi angles using a Huber goniometer. The L1(1) CoPt phase with perpendicular magnetocrystalline anisotropy can be developed at 250 degrees C, thus making it a promising material for future ultra-high-density magnetic recording media. (C) 2009 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

引用

页码：713 / 716

页数：4

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