Systematic Modeling of On-chip Power Grids with Decaps in TSV-based 3D Chip Integration

被引:0
|
作者
Oo, Zaw Zaw [1 ]
机构
[1] ASTAR, Inst High Performance Comp, Elect & Photon Dept, Singapore 138632, Singapore
关键词
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Efficient modeling of power supply noises is crucial for a robust power supply design, especially with increase in the size of on-chip power grids due to emerging 3D chip integration technology. As the power grid is interconnected vertically by through-silicon vias (TSVs), operational currents required by each functional device in integrated circuits (ICs) are supplied through vertical power and ground TSVs, and horizontal power grids. Fast switching speed of the devices become complicated the accurate analysis of the worst ease power supply noises. In this paper, a systematic modeling of on-chip power grids with decoupling capacitors - VNCAPs - used in TSV-based chip integration technology is presented using novel equivalent decap circuit model. The equivalent circuit model will be numerically validated and integrated into an efficient modeling for impedance profile of on-chip power grids and analysis of power supply noises in TSV-based 3D chip integration technology.
引用
收藏
页码:575 / 578
页数:4
相关论文
共 50 条
  • [1] Power Integrity Modeling, Measurement and Analysis of Seven-Chip Stack for TSV-based 3D IC Integration
    Lee, Hui Min
    Liu, En-Xiao
    Samudra, G. S.
    Li, Er-Ping
    2015 ASIA-PACIFIC INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (APEMC), 2015, : 689 - 692
  • [2] TSV-based antenna for on-chip wireless communication
    Pano, Vasil
    Tekin, Ibrahim
    Liu, Yuqiao
    Dandekar, Kapil R.
    Taskin, Baris
    IET MICROWAVES ANTENNAS & PROPAGATION, 2020, 14 (04) : 302 - 307
  • [3] TSV-Based On-Chip Inductive Coupling Communications
    Salah, Khaled
    El-Rouby, Alaa
    Ragai, Hani
    Ismail, Yehea
    2013 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS), 2013, : 1672 - 1675
  • [4] Characterizing the On-chip Temperature of an Off-the-shelf TSV-based 3D Stacked CPU
    Kwon, Ji Hun
    Choi, Seung Hun
    Chung, Sung Woo
    PROCEEDINGS OF THE TWENTIETH INTERSOCIETY CONFERENCE ON THERMAL AND THERMOMECHANICAL PHENOMENA IN ELECTRONIC SYSTEMS (ITHERM 2021), 2021, : 491 - 498
  • [5] A Closed Form Expression for TSV-Based On-Chip Spiral Inductor
    Salah, Khaled
    El Rouby, Alaa
    Ragai, Hani
    Ismail, Yehea
    2012 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS 2012), 2012, : 2325 - 2328
  • [6] Effects of On-Chip Decoupling Capacitors and Silicon Substrate on Power Distribution Networks in TSV-based 3D-ICs
    Kim, Kiyeong
    Pak, Jun So
    Lee, Hyungdong
    Kim, Joungho
    2012 IEEE 62ND ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2012, : 690 - 697
  • [7] On-Chip PDN Design Effects on 3D Stacked On-Chip PDN Impedance based on TSV Interconnection
    Pak, Jun So
    Kim, Joohee
    Cho, Jonghyun
    Lee, Junho
    Lee, Hyungdong
    Park, Kunwoo
    Kim, Joungho
    2010 IEEE ELECTRICAL DESIGN OF ADVANCED PACKAGE & SYSTEMS SYMPOSIUM, 2010,
  • [8] Electromigration Modeling and Full-chip Reliability Analysis for BEOL Interconnect in TSV-based 3D ICs
    Pathak, Mohit
    Pak, Jiwoo
    Pan, David Z.
    Lim, Sung Kyu
    2011 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD), 2011, : 555 - 562
  • [9] Analytical Fault Tolerance Assessment and Metrics for TSV-Based 3D Network-on-Chip
    Eghbal, Ashkan
    Yaghini, Pooria M.
    Bagherzadeh, Nader
    Khayambashi, Misagh
    IEEE TRANSACTIONS ON COMPUTERS, 2015, 64 (12) : 3591 - 3604
  • [10] TSV-Based 3D Integration Fabrication Technologies: An Overview
    Salah, Khaled
    2014 9TH INTERNATIONAL DESIGN & TEST SYMPOSIUM (IDT), 2014, : 253 - 256