Applications of a new theory on the X-ray energy responses of semiconductor detectors to plasma X-ray diagnostics

被引：0

作者：

Kohagura, J ^{[1
]}

Cho, T ^{[1
]}

Hirata, M ^{[1
]}

Yatsu, K ^{[1
]}

Tamano, T ^{[1
]}

Hirano, K ^{[1
]}

Maezawa, H ^{[1
]}

机构：

[1] NATL INST HIGH ENERGY PHYS, TSUKUBA, IBARAKI 305, JAPAN

来源：

FUSION ENGINEERING AND DESIGN | 1997年 / 34-35卷

关键词：

D O I：

10.1016/S0920-3796(96)00679-5

中图分类号：

TL [原子能技术]; O571 [原子核物理学];

学科分类号：

0827 ; 082701 ;

摘要：

Our recently proposed theory on X-ray energy responses of semiconductor detectors is based on the physics principle of the three-dimensional diffusion of X-ray-produced charges in a semiconductor field-free substrate region. In this paper, this diffusion process is experimentally verified using a spatially distributed charge profile produced by an X-ray beam in a multi-channel semiconductor detector. Actual X-ray profile data are distorted because of the effect of the diffusion. Using this theoretical principle, a new X-ray analysis method for obtaining plasma electron temperature profiles (that have no dependence on plasma densities) is proposed. (C) 1997 Elsevier Science S.A.

引用

页码：183 / 187

页数：5

共 50 条

[21] A new facility for the developement of new X-ray detectors: The X-ray Calibration Facility
Frassa, A.
Aglietta, M.
Bonino, R.
Gorgi, A.
Latronico, L.
Maldera, S.
Marengo, M.
Messina, P. L.
Tugliani, S.
NUOVO CIMENTO C-COLLOQUIA AND COMMUNICATIONS IN PHYSICS, 2025, 48 (03):
[22] Epitaxial GaAs X-ray detectors for X-ray astrophysics
Bavdaz, M
Owens, A
Peacock, A
HARD X-RAY, GAMMA-RAY, AND NEUTRON DETECTOR PHYSICS, 1999, 3768 : 451 - 456
[23] X-RAY EXPOSURE AND RADIATION PROTECTION IN X-RAY DIAGNOSTICS
SCHMIDT, T
ATOMKERNENERGIE, 1973, 22 (02): : 129 - 133
[24] Energy dispersive X-ray spectroscopy for ECR plasma diagnostics
Friedlein, R
Kuchler, D
Zippe, C
Zschornack, G
Tyrroff, H
HYPERFINE INTERACTIONS, 1996, 99 (1-3): : 225 - 234
[25] Energy dispersive X-ray spectroscopy for ECR plasma diagnostics
Hyperfine Interact, 1-3 (225):
[26] Characterization and diagnostics of fast X-ray imaging detectors for X-ray free electron laser sources
Castoldi, Andrea
Guazzoni, Chiara
Mezza, Davide
Carraresi, Luca
Taccetti, Francesco
ADVANCES IN X-RAY FREE-ELECTRON LASERS: RADIATION SCHEMES, X-RAY OPTICS, AND INSTRUMENTATION, 2011, 8078
[27] EFFECTS OF THE NEW X-RAY REGULATIONS ON X-RAY-DIAGNOSTICS
MONIG, H
WENZ, W
RADIOLOGE, 1988, 28 (01): : 12 - 19
[28] Experimental characterization of low-energy X-ray semiconductor detectors
Lépy, MC
Campbell, J
Laborie, JM
Plagnard, J
Stemmler, P
Teesdale, WJ
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1999, 422 (1-3): : 428 - 432
[29] High energy X-ray computed tomography using semiconductor detectors
Chirco, P
Casali, F
Baldazzi, G
Querzola, E
Rossi, M
Zanarini, M
APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY - PROCEEDINGS OF THE FOURTEENTH INTERNATIONAL CONFERENCE, PTS 1 AND 2, 1997, (392): : 891 - 894
[30] Measurement of Soft X-Ray Radiation using the PF-4 Plasma Focus Setup with Semiconductor X-Ray Detectors
Eliseev, S. P.
Nikulin, V. Ya.
Silin, P. V.
BULLETIN OF THE LEBEDEV PHYSICS INSTITUTE, 2009, 36 (01) : 1 - 7

← 1 2 3 4 5 →