共 50 条
- [41] Aliphatic platforms for the design of 157 nm chemically amplified resists ADVANCES IN RESIST TECHNOLOGY AND PROCESSING XIX, PTS 1 AND 2, 2002, 4690 : 18 - 28
- [42] Study of 157 nm resists with full field exposure tools Advances in Resist Technology and Processing XXII, Pt 1 and 2, 2005, 5753 : 572 - 583
- [43] 157 nm imaging using thick single layer resists ADVANCES IN RESIST TECHNOLOGY AND PROCESSING XVIII, PTS 1 AND 2, 2001, 4345 : 428 - 438
- [44] Progress in 157 nm lithography development at Intel: Resists and reticles OPTICAL MICROLITHOGRAPHY XIII, PTS 1 AND 2, 2000, 4000 : 1574 - 1581
- [48] Evaluation of fluorinated dissolution inhibitors for 157 nm lithography ADVANCES IN RESIST TECHNOLOGY AND PROCESSING XX, PTS 1 AND 2, 2003, 5039 : 558 - 568
- [49] DEVS representation of differential equation systems: Review of recent advances. SIMULATION IN INDUSTRY 2001, 2001, : 591 - 595
- [50] Design of transparent fluoropolymer resists for semiconductor manufacture at 157 nm. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2002, 224 : U545 - U545