A Flash ADC Tolerant to High Offset Voltage Comparators

被引:2
|
作者
Couto-Pinto, Antonio [1 ]
Fernandes, Jorge R. [2 ]
Piedade, Moises [2 ]
Silva, Manuel M. [2 ]
机构
[1] Inst Super Engn Lisboa, Dept Elect Telecommun & Comp Engn, INESC ID Lisboa, P-1959007 Lisbon, Portugal
[2] Univ Lisbon, Inst Super Tecn, INESC ID Lisboa, P-1049001 Lisbon, Portugal
关键词
Analog-digital conversion; Flash ADC; Wallace tree; Stochastic errors; Offset voltage; REDUNDANCY; CALIBRATION;
D O I
10.1007/s00034-016-0350-3
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A conventional flash analog-to-digital converter (ADC) with a Wallace tree encoder ensures monotonicity and avoids missing codes, but still requires comparators with low offset voltage, which implies high area and power consumption. In this paper, we extend the purpose of this flash implementation, to allow the comparators to have extremely high offset voltages. This leads to a new approach toward the design of a flash ADC that does not require any type of calibration, allow easy porting among technologies and benefits from scaling. A statistical study is presented to demonstrate the effectiveness of the new method, and a modification is proposed to ensure full-range operation. It is shown that a proposed N-bit ADC has a performance equivalent to an -bit conventional flash ADC, with considerable gains in area and power consumption, with less design effort. The design flow of the OST ADC, with the necessary steps, is presented. A circuit, employing minimum dimension transistors, was fabricated in 0.13- CMOS and used as a proof of concept for the ADCs proposed here.
引用
收藏
页码:1150 / 1168
页数:19
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