Three-dimensional reciprocal space profile of an individual nanocrystallite inside a thin-film solar cell absorber layer

被引：0

作者：

Slobodskyy, Taras ^{[1
]}

Schroth, Philip ^{[2
]}

Minkevich, Andrey ^{[2
]}

Grigoriev, Daniil ^{[2
]}

Fohtung, Edwin ^{[2
]}

Riotte, Markus ^{[2
]}

Baumbach, Tilo ^{[2
]}

Powalla, Michael ^{[3
]}

Lemmer, Uli ^{[4
]}

Slobodskyy, Anatoliy ^{[4
]}

机构：

[1] Univ Hamburg, Inst Appl Phys, D-20355 Hamburg, Germany

[2] Karlsruhe Inst Technol KIT, Inst Synchrotron Radiat, D-76344 Eggenstein Leopoldshafen, Germany

[3] Zentrum Sonnenenergie & Wasserstoff Forsch ZSW, D-70565 Stuttgart, Germany

[4] Karlsruhe Inst Technol KIT, Light Technol Inst LTI, D-76131 Karlsruhe, Germany

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 2013年 / 46卷 / 47期

关键词：

STRAIN;

D O I：

10.1088/0022-3727/46/47/475104

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The strain profile of an individual Cu(In, Ga)Se-2 nanocrystallite in a solar cell absorber layer is accessed using synchrotron radiation. We find that the investigated crystallite is inhomogeneously strained. The strain is most likely produced by a combination of intergranular strain and composition variations in nanocrystals inside the polycrystalline semiconductor film and carries information about the intercrystalline interaction. The measurements are made nondestructively and without additional sample preparation or x-ray beam nanofocusing. This is the first step towards measurements of strain profiles of individual crystallites inside a working solar cell.

引用

页数：5

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