Aspects of the structural evolution of lead-free solder joints

被引:25
|
作者
Zribi, A
Kinyanjui, R
Borgesen, P
Zavalij, L
Cotts, EJ
机构
[1] SUNY Binghamton, Dept Phys, Binghamton, NY 13902 USA
[2] SUNY Binghamton, Mat Sci Program, Binghamton, NY 13902 USA
[3] Universal Instruments Corp, Kirkwood, NY USA
基金
美国国家科学基金会;
关键词
D O I
10.1007/BF02701848
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Studies of the formation of intermetallic compounds at some lead-free solder/ metallization interfaces are briefly reviewed in this article. SnAgCu/Ni and SnAgCu/Cu interfaces are examined in particular. It has been found that (Cu,Ni)(6)Sn-5 forms at SnAgCu/Ni interfaces until copper is depleted from the solder matrix. This article also contrasts the formation of (Au,Ni)Sn-4 and related compounds in PbSn/Ni solder joints and lead-free solder joints.
引用
收藏
页码:38 / 40
页数:3
相关论文
共 50 条
  • [31] Infant Mortality Failures of Lead-Free Solder Joints
    Szwech, M.
    Niedzwiedz, W.
    Drozd, Z.
    2009 32ND INTERNATIONAL SPRING SEMINAR ON ELECTRONICS TECHNOLOGY, 2009, : 304 - +
  • [32] Reliability testing of WLCSP lead-free solder joints
    Huann-Wu Chiang
    Jun-Yuan Chen
    Ming-Chuan Chen
    Jeffrey C. B. Lee
    Gary Shiau
    Journal of Electronic Materials, 2006, 35 : 1032 - 1040
  • [33] Nanoindentation on SnAgCu lead-free solder joints and analysis
    Xu, Luhua
    Pang, John H. L.
    JOURNAL OF ELECTRONIC MATERIALS, 2006, 35 (12) : 2107 - 2115
  • [34] Electromigration Induced Stress in Lead-Free Solder Joints
    Ni, Jiamin
    Maniatty, Antoinette
    Liu, Yong
    Hao, Jifa
    Ring, Matt
    2016 IEEE 66TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2016, : 538 - 543
  • [35] The effects of suppressed beta tin nucleation on the microstructural evolution of lead-free solder joints
    Swenson, D.
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2007, 18 (1-3) : 39 - 54
  • [36] The effects of suppressed beta tin nucleation on the microstructural evolution of lead-free solder joints
    D. Swenson
    Journal of Materials Science: Materials in Electronics, 2007, 18 : 39 - 54
  • [37] A study on μBGA solder joints reliability using lead-free solder materials
    Shin, YE
    Lee, JH
    Koh, YW
    Lee, CW
    Yun, JH
    Jung, SB
    KSME INTERNATIONAL JOURNAL, 2002, 16 (07): : 919 - 926
  • [38] A study on μBGA solder joints reliability using lead-free solder materials
    Young-Eui Shin
    Jun Hwan Lee
    Young-Wook Koh
    Chong-Won Lee
    Jun Ho Yun
    Seung-Boo Jung
    KSME International Journal, 2002, 16 : 919 - 926
  • [39] Lead-free solder
    Black, H
    CHEMISTRY & INDUSTRY, 2005, (21) : 22 - 23
  • [40] Size effects in small scaled lead-free solder joints
    Zimprich, P.
    Betzwar-Kotas, A.
    Khatibi, G.
    Weiss, B.
    Ipser, H.
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2008, 19 (04) : 383 - 388