Green luminescence in Mg-doped GaN

被引:129
|
作者
Reshchikov, M. A. [1 ]
Demchenko, D. O. [1 ]
McNamara, J. D. [1 ]
Fernandez-Garrido, S. [2 ]
Calarco, R. [2 ]
机构
[1] Virginia Commonwealth Univ, Dept Phys, Richmond, VA 23284 USA
[2] Paul Drude Inst Festkorperlektron, D-10117 Berlin, Germany
关键词
PHOTOLUMINESCENCE BANDS; ENERGY; PLASMA; DEFECTS; GALLIUM;
D O I
10.1103/PhysRevB.90.035207
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A majority of the point defects in GaN that are responsible for broad photoluminescence (PL) bands remain unidentified. One of them is the green luminescence band (GL2) having a maximum at 2.35 eV which was observed previously in undoped GaN grown by molecular-beam epitaxy in Ga-rich conditions. The same PL band was observed in Mg-doped GaN, also grown in very Ga-rich conditions. The unique properties of the GL2 band allowed us to reliably identify it in different samples. The best candidate for the defect which causes the GL2 band is a nitrogen vacancy (V-N). We propose that transitions of electrons from the conduction band to the +/2+ transition level of the V-N defect are responsible for the GL2 band in high-resistivity undoped and Mg-doped GaN.
引用
收藏
页数:14
相关论文
共 50 条
  • [21] Photocurrent response in Mg-doped GaN
    Qiu, CH
    Pankove, JI
    Akasaki, I
    Amano, H
    NITRIDE SEMICONDUCTORS, 1998, 482 : 519 - 524
  • [22] Noise measurements in Mg-doped GaN
    Seghier, D
    Gislason, HP
    Physics of Semiconductors, Pts A and B, 2005, 772 : 229 - 230
  • [23] Photoluminescence spectroscopy of Mg-doped GaN
    Sheu, JK
    Su, YK
    Chi, GC
    Pong, BJ
    Chen, CY
    Huang, CN
    Chen, WC
    JOURNAL OF APPLIED PHYSICS, 1998, 84 (08) : 4590 - 4594
  • [24] Fabrication and characterization of Mg-doped GaN nanowires
    Institute of Semiconductors, College of Physics and Electronics, Shandong Normal University, Jinan 250014, China
    Chin. Phys. Lett., 2008, 11 (4158-4161):
  • [25] Noise processes and their origin in Mg-doped GaN
    Seghier, D
    Gislason, HP
    SMIC-XIII: 2004 13th International Conference on Semiconducting & Insulating Materials, 2004, : 226 - 229
  • [26] Stacking fault effects in Mg-doped GaN
    Schmidt, TM
    Miwa, RH
    Orellana, W
    Chacham, H
    PHYSICAL REVIEW B, 2002, 65 (03) : 1 - 4
  • [27] Compensation effects in Mg-doped GaN epilayers
    Eckey, L
    Von Gfug, U
    Holst, J
    Hoffmann, A
    Schineller, B
    Heime, K
    Heuken, M
    Schon, O
    Beccard, R
    JOURNAL OF CRYSTAL GROWTH, 1998, 189 : 523 - 527
  • [28] MOVPE growth and characterization of Mg-doped GaN
    Kozodoy, P
    Keller, S
    DenBaars, S
    Mishra, UK
    JOURNAL OF CRYSTAL GROWTH, 1998, 195 (1-4) : 265 - 269
  • [29] Deep level defects in Mg-doped GaN
    Yi, GC
    Wessels, BW
    III-NITRIDE, SIC AND DIAMOND MATERIALS FOR ELECTRONIC DEVICES, 1996, 423 : 525 - 530
  • [30] Fabrication and Characterization of Mg-Doped GaN Nanowires
    Zhang Dong-Dong
    Xue Cheng-Shan
    Zhuang Hui-Zhao
    Huang Ying-Long
    Wang Zou-Ping
    Wang Ying
    Guo Yong-Fu
    CHINESE PHYSICS LETTERS, 2008, 25 (11) : 4158 - 4161