Single-Crystalline Hexagonal Silicon-Germanium

被引:64
|
作者
Hauge, Hakon Ikaros T. [1 ]
Conesa-Boj, Sonia [1 ,3 ]
Verheijen, Marcel A. [1 ,2 ]
Koelling, Sebastian [1 ]
Bakkers, Erik P. A. M. [1 ,3 ]
机构
[1] Eindhoven Univ Technol, Dept Appl Phys, NL-5600 MB Eindhoven, Netherlands
[2] Philips Innovat Labs, High Tech Campus 11, NL-5656 AE Eindhoven, Netherlands
[3] Delft Univ Technol, Kavli Inst Nanosci, NL-2628 CJ Delft, Netherlands
基金
欧洲研究理事会;
关键词
Silicon-germanium; hexagonal crystal structure; core/shell nanowire; single-crystalline; growth rate; kinetics; BAND-STRUCTURE; ELECTRONIC-PROPERTIES; SIGE; GE; DIFFUSION; NANOWIRES; GROWTH; STRAIN; DECOMPOSITION; DESORPTION;
D O I
10.1021/acs.nanolett.6b03488
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Group IV materials with the hexagonal diamond crystal structure have been predicted to exhibit promising optical and electronic properties. In particular; hexagonal silicon germanium (Si1-xGex) should be characterized by a tunable direct band gap with implications ranging from Si-based light-emitting diodes to lasers and quantum, dots for single photon emitters. Here we demonstrate the feasibility of high-quality defect-free and wafer-scale hexagonal Si1-xGex growth with precise control of the alloy composition and layer thickness. This is achieved by transferring the hexagonal phase from a GaP/Si core/shell nanowire template, the same method successfully employed by us to realize hexagonal Si. We determine the optimal growth conditions in order to achieve single crystalline layer-by-layer Si1-xGex growth in the preferred stoichiometry region. Our results pave the way for exploiting the novel properties of hexagonal Si1-xGex alloys in technological applications.
引用
收藏
页码:85 / 90
页数:6
相关论文
共 50 条
  • [41] Dynamic fracture of glass and single-crystalline silicon
    Max-Planck-Inst. fur Metallforschung, Stuttgart, Germany
    不详
    不详
    不详
    Z Metallkd, 9 (675-686):
  • [42] Monolithic and Single-Crystalline Aluminum Silicon Heterostructures
    Wind, Lukas
    Boeckle, Raphael
    Sistani, Masiar
    Schweizer, Peter
    Maeder, Xavier
    Michler, Johann
    Murphey, Corban G. E.
    Cahoon, James
    Weber, Walter M.
    ACS APPLIED MATERIALS & INTERFACES, 2022, 14 (22) : 26238 - 26244
  • [43] Relaxation of Magnetosensitive Impurities in Single-Crystalline Silicon
    Makara, V. A.
    Steblenko, L. P.
    Bokoch, S. M.
    Kuryliuk, A. M.
    Kobzar, Iu L.
    METALLOFIZIKA I NOVEISHIE TEKHNOLOGII, 2013, 35 (02): : 265 - 278
  • [44] VACUUM DEPOSITION OF SINGLE-CRYSTALLINE SILICON ON SAPPHIRE
    WEISBERG, LR
    MILLER, EA
    TRANSACTIONS OF THE METALLURGICAL SOCIETY OF AIME, 1968, 242 (03): : 479 - &
  • [45] Recent progress on nanowear of single-crystalline silicon
    Yu, Bingjun
    Yu, Jiaxin
    Chen, Lei
    Qian, Linmao
    Zhou, Zhongrong
    Kim, Seong H.
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2012, 244
  • [46] Dynamic crack propagation in single-crystalline silicon
    Cramer, T
    Wanner, A
    Gumbsch, P
    FRACTURE AND DUCTILE VS. BRITTLE BEHAVIOR-THEORY, MODELLING AND EXPERIMENT, 1999, 539 : 181 - 186
  • [47] Dynamic fracture of glass and single-crystalline silicon
    Cramer, T
    Wanner, A
    Gumbsch, P
    ZEITSCHRIFT FUR METALLKUNDE, 1999, 90 (09): : 675 - 686
  • [48] SILICON-GERMANIUM - THE INTEGRATED FUTURE
    MOSELY, J
    ELECTRONICS WORLD & WIRELESS WORLD, 1994, (1701): : 656 - 658
  • [49] Role of Tribochemistry in Nanowear of Single-Crystalline Silicon
    Yu, Jiaxin
    Kim, Seong H.
    Yu, Bingjun
    Qian, Linmao
    Zhou, Zhongrong
    ACS APPLIED MATERIALS & INTERFACES, 2012, 4 (03) : 1585 - 1593
  • [50] Thermal conductivity of silicon, germanium and silicon-germanium single crystals between 85 K and 300 K
    Freund, AK
    Gillet, JA
    Zhang, L
    CRYSTAL AND MULTILAYER OPTICS, 1998, 3448 : 362 - 372