Optical and Microwave Properties of Focused Ion Beam Implanted Erbium Ions in Y2SiO5 Crystals

被引：0

作者：

Kukharchyk, Nadezhda ^{[1
]}

Probst, Sebastian ^{[2
]}

Pal, Shovon ^{[1
]}

Xia, Kangwei ^{[3
]}

Kolesov, Roman ^{[3
]}

Ludwig, Arne ^{[1
]}

Ustinov, Alexey V. ^{[2
]}

Bushev, Pavel ^{[4
]}

Wieck, Andreas D. ^{[1
]}

机构：

[1] Ruhr Univ Bochum, Angew Festkorperphys, D-44780 Bochum, Germany

[2] Karlsruhe Inst Technol, Inst Phys, D-76128 Karlsruhe, Germany

[3] Univ Stuttgart, Phys Inst 3, D-70569 Stuttgart, Germany

[4] Univ Saarland, Expt Phys, D-66123 Saarbrucken, Germany

来源：

2015 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) | 2015年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We present focused ion beam implantation as a prospective tool for realizing a patterned rare-earth spin-ensemble in a solid-state substrate. We demonstrate a successful implantation with 20% of luminescent ion activation for Erbium ions in Y2SiO5 crystals.

引用

页数：2

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