Noise Characterization of Double-Sided Silicon MicroStrip Detectors with Punch-Through Biasing

被引：0
|
作者：
Giacomini, Gabriele [1 ,2 ]
Bosisio, Luciano [1 ,3 ]
Rashevskaya, Irina [1 ]
Starodubtsev, Oleksandr [1 ]
机构：
[1] INFN Trieste, Padriciano 99, I-34012 Trieste, Italy
[2] FBK Irst, I-38123 Trento, Italy
[3] Univ Trieste, Dept Phys, I-34127 Trieste, Italy
来源：
2008 IEEE NUCLEAR SCIENCE SYMPOSIUM AND MEDICAL IMAGING CONFERENCE (2008 NSS/MIC), VOLS 1-9 | 2009年
关键词：
ALICE EXPERIMENT;
D O I：
暂无
中图分类号：
R8 [特种医学]; R445 [影像诊断学];
学科分类号：
1002 ; 100207 ; 1009 ;
摘要：
We report on extensive noise measurements performed on double-sided, AC-coupled, punch-through biased silicon strip detectors. We used a single-channel acquisition chain, reading one strip per side, all other strips being kept grounded. The noise has been measured over a wide range of peaking times and leakage currents, allowing a careful determination of the various noise contributions. We determined the noise of the punch-through mechanism and we observed, on different sensors, two unexpected noise terms, one related to the punch-through current and the other to the presence of resistive layers at the Si/SiO2 interface.
引用
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页码：1791 / +
页数：2
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