Noise Characterization of Double-Sided Silicon MicroStrip Detectors with Punch-Through Biasing

被引：0

作者：

Giacomini, Gabriele ^{[1
,2
]}

Bosisio, Luciano ^{[1
,3
]}

Rashevskaya, Irina ^{[1
]}

Starodubtsev, Oleksandr ^{[1
]}

机构：

[1] INFN Trieste, Padriciano 99, I-34012 Trieste, Italy

[2] FBK Irst, I-38123 Trento, Italy

[3] Univ Trieste, Dept Phys, I-34127 Trieste, Italy

来源：

2008 IEEE NUCLEAR SCIENCE SYMPOSIUM AND MEDICAL IMAGING CONFERENCE (2008 NSS/MIC), VOLS 1-9 | 2009年

关键词：

ALICE EXPERIMENT;

D O I：

暂无

中图分类号：

R8 [特种医学]; R445 [影像诊断学];

学科分类号：

1002 ; 100207 ; 1009 ;

摘要：

We report on extensive noise measurements performed on double-sided, AC-coupled, punch-through biased silicon strip detectors. We used a single-channel acquisition chain, reading one strip per side, all other strips being kept grounded. The noise has been measured over a wide range of peaking times and leakage currents, allowing a careful determination of the various noise contributions. We determined the noise of the punch-through mechanism and we observed, on different sensors, two unexpected noise terms, one related to the punch-through current and the other to the presence of resistive layers at the Si/SiO2 interface.

引用

页码：1791 / +

页数：2

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