Reliability Evaluation of Turbo Decoders Implemented on SRAM-FPGAs

被引:6
|
作者
Gao, Zhen [1 ]
Zhang, Lingling [1 ]
Han, Ruishi [1 ]
Reviriego, Pedro [2 ]
Li, Zhiqiang [3 ]
机构
[1] Tianjin Univ, Sch Elect & Informat Engn, Tianjin, Peoples R China
[2] Univ Carlos III Madrid, Dept Ingn Telemat, Madrid, Spain
[3] Luoyang Newvid Technol Co Ltd, Luoyang, Peoples R China
基金
中国国家自然科学基金; 中国博士后科学基金;
关键词
Turbo decoder; Single Event Upsets (SEU); reliability; FPGA; user memory; configuration memory; SYSTEMS;
D O I
10.1109/vts48691.2020.9107638
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Turbo codes are widely used in satellite communications. When a Turbo decoder is implemented on a Field Programmable Gate Array (FPGA) in a space platform, it will suffer Single Event Upsets (SEUs) that can cause failures and disrupt communications. In this paper, the reliability of Turbo decoders implemented on FPGAs is evaluated. The Turbo decoder with Log-MAP algorithm is implemented on an SRAM-FPGA. Then, fault injection experiments are conducted to simulate the effects of SEU on the user memory and on the configuration memory of the Turbo decoder. Experimental results show that, for user memory, the SEU tolerance rate is over 95%, and the effect of SEU is related to the iteration period, bit position and Signal to Noise Ratio (SNR). In particular, SEUs on the control/address registers and on the interleaving table have a larger impact than on other registers or memories. For the configuration memory, the SEU tolerance rate is higher than 86%, and decreases as SNR increases. In general, the Turbo decoder exhibits a high reliability against SEUs, and the user memory is more reliable than the configuration memory.
引用
收藏
页数:6
相关论文
共 50 条
  • [21] A new read–write collision-based SRAM PUF implemented on Xilinx FPGAs
    Ihsan Cicek
    Ahmad Al Khas
    Journal of Cryptographic Engineering, 2023, 13 : 19 - 36
  • [22] Fault Tolerant Design of Large-Scale Digital Beam Forming in SRAM-FPGAs for Software Defined Satellite Platforms
    Gao, Zhen
    Zhu, Jinhua
    Yan, Tong
    Guo, Linghua
    Chen, Xiangping
    Li, Yinqiao
    Wan, Xiaolei
    CHINA COMMUNICATIONS, 2020, 17 (07) : 67 - 79
  • [23] On the evaluation of SEU sensitiveness in SRAM-based FPGAs
    Bernardi, P
    Reorda, MS
    Sterpone, L
    Violante, M
    10TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM, PROCEEDINGS, 2004, : 115 - 120
  • [24] Design and Implementation of Configuration Memory SEU-Tolerant Viterbi Decoders in SRAM-Based FPGAs
    Gao, Zhen
    Zhu, Jinhua
    Han, Ruishi
    Xu, Zhan
    Ullah, Anees
    Reviriego, Pedro
    IEEE TRANSACTIONS ON NANOTECHNOLOGY, 2019, 18 : 691 - 699
  • [25] Reliability Analysis of ASIC Designs With Xilinx SRAM-Based FPGAs
    Aranda, Luis Alberto
    Ruano, Oscar
    Garcia-Herrero, Francisco
    Maestro, Juan Antonio
    IEEE ACCESS, 2021, 9 : 140676 - 140685
  • [26] Improving reliability of SRAM-based FPGAs by inserting redundant routing
    Lima Kastensmidt, Ferrianda
    Kinzel Filho, Caio
    Carro, Luigi
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2006, 53 (04) : 2060 - 2068
  • [27] Reliability Assessment of Backward Error Recovery for SRAM-based FPGAs
    Fouad, Sahraoui
    Ghaffari, Fakhreddine
    Benkhelifa, Mohamed El Amine
    Granado, Bertrand
    2014 9TH INTERNATIONAL DESIGN & TEST SYMPOSIUM (IDT), 2014, : 248 - 252
  • [28] A new read-write collision-based SRAM PUF implemented on Xilinx FPGAs
    Cicek, Ihsan
    Al Khas, Ahmad
    JOURNAL OF CRYPTOGRAPHIC ENGINEERING, 2023, 13 (01) : 19 - 36
  • [29] A New Analytical Approach to Evaluate the Radiation Sensitivity of Circuits Implemented on SRAM-Based FPGAs
    Bricas, Gaetan
    Tsiligiannis, Georgios
    Boch, Jerome
    Bricas, Samuel
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2024, 71 (10) : 2230 - 2241
  • [30] Reliability evaluation of repairable/reconfigurable FPGAs
    Pontarelli, S.
    Ottavi, M.
    Vankamamidi, V.
    Salsano, A.
    Lombardi, F.
    21ST IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT-TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS, 2006, : 227 - +