From device aging physics to automated circuit reliability sign off

被引：2
|
作者：
Schluender, Christian [1 ]
Waschneck, Katja [2 ]
Rotter, Peter [1 ]
Lachenmann, Susanne [1 ]
Reisinger, Hans [2 ]
Ungar, Franz [1 ]
Georgakos, Georg [1 ]
机构：
[1] Infineon Technol AG, Design Enabling & Serv Dept, D-85579 Neubiberg, Germany
[2] Infineon Technol AG, Reliabil & Qualificat Dept, D-85579 Neubiberg, Germany
来源：
2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS) | 2019年
关键词：
HOT-CARRIER DEGRADATION; P-MOSFETS; ANALOG;
D O I：
10.1109/irps.2019.8720457
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页数：12
相关论文
共 50 条
  • [1] Physics-based device aging modelling framework for accurate circuit reliability assessment
    Wu, Zhicheng
    Franco, Jacopo
    Truijen, Brecht
    Roussel, Philippe
    Tyaginov, Stanislav
    Vandemaele, Michiel
    Bury, Erik
    Groeseneken, Guido
    Linten, Dimitri
    Kaczer, Ben
    2021 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2021,
  • [2] CMOS Reliability: From Discrete Device Degradation to Circuit Aging
    Nigam, Tanya
    2013 INTERNATIONAL SYMPOSIUM ON VLSI DESIGN, AUTOMATION, AND TEST (VLSI-DAT), 2013,
  • [3] CMOS Reliability: From Discrete Device Degradation to Circuit Aging
    Nigam, Tanya
    2013 INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY, SYSTEMS, AND APPLICATIONS (VLSI-TSA), 2013,
  • [4] Concurrent Device/Circuit Aging for General Reliability Simulations
    Jiang, Haoyuan
    Ma, Chenyue
    Zhang, Lining
    Chan, Mansun
    2016 INTERNATIONAL SYMPOSIUM ON INTEGRATED CIRCUITS (ISIC), 2016,
  • [5] A Device to Circuit Reliability Framework for BTI and HCD Aging
    Chatterjee, Payel
    Thakor, Karan Singh
    Mahapatra, Souvik
    8TH IEEE ELECTRON DEVICES TECHNOLOGY & MANUFACTURING CONFERENCE, EDTM 2024, 2024, : 744 - 746
  • [6] Circuit Reliability: From Physics to Architectures
    Fang, Jianxin
    Gupta, Saket
    Kumar, Sanjay V.
    Marella, Sravan K.
    Mishra, Vivek
    Zhou, Pingqiang
    Sapatnekar, Sachin S.
    2012 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD), 2012, : 243 - 246
  • [7] Device physics - The heat is on - and off
    Casati, Giulio
    NATURE NANOTECHNOLOGY, 2007, 2 (01) : 23 - 24
  • [8] Reliability and Aging Aware Designs/Circuit Reliability
    Yu, Shimeng
    2022 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2022,
  • [9] Device and reliability physics of capacitive MEMS
    Gusev, Evgeni
    PROCEEDINGS OF THE ASME/STLE INTERNATIONAL JOINT TRIBOLOGY CONFERENCE, PTS A AND B, 2008, : 831 - 831
  • [10] CMOS RF device and circuit reliability
    Yuan, JS
    EDMO2003: 11TH IEEE INTERNATIONAL SYMPOSIUM ON ELECTRON DEVICES FOR MICROWAVE AND OPTOELECTRONIC APPLICATIONS, 2003, : 174 - 179
12345