Simulation and optimization of a broadband reflective far ultraviolet polarimeter

被引:2
|
作者
Le Gal, Maelle [1 ]
Ariste, Arturo Lopez [2 ]
Neiner, Coralie [1 ]
Pertenais, Martin [3 ]
机构
[1] Univ Paris, Sorbonne Univ, Univ PSL, CNRS,Observ Paris,LESIA, 5 Pl Jules Janssen, F-92195 Meudon, France
[2] Univ Toulouse, CNRS, CNES, IRAP, 14 Av E Berlin, F-31400 Toulouse, France
[3] Deutsch Zentrum Luft & Raumfahrt eV DLR, Inst Opt Sensor Syst, Rutherfordstr 2, D-12489 Berlin, Germany
关键词
MATRICES; COATINGS;
D O I
10.1364/AO.397984
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Traditional transmissive polarimetric methods can be used for wavelengths above 123 nm where birefringent materials transmit light and create significant birefringence. Below 123 nm, no suitable solution is known to measure the four Stokes parameters on a large wavelength range. Therefore, we study here an innovative reflective (rather than transmissive) polarimeter working in the far ultraviolet (FUV) range from 90 to 130 nm. We take advantage of the phase shift created by reflections as well as the different reflectivities for p (orthogonal perpendicular to) and s (parallel parallel to to the plane of incidence) polarizations to design an FUV polarimeter. Simulation of the analyzer and modulator using Mueller matrices coupled to polarimetric efficiencies calculations allowed optimization of reflective polarimeters for the first time, to the best of our knowledge. This opens up a new perspective for FUV polarimetry below 123 nm. (C) 2020 Optical Society of America
引用
收藏
页码:9320 / 9327
页数:8
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