Compact Model of a CBRAM Cell in Verilog-A

被引:0
|
作者
Reyboz, M. [1 ]
Onkaraiah, S. [1 ]
Palma, G. [1 ]
Vianello, E. [1 ]
Perniola, L. [1 ]
机构
[1] CEA, LETI, MINATEC Campus,17 Rue Martyrs, F-38054 Grenoble 9, France
关键词
CBRAM; resistive memory; NV RAM; compact modeling; Verilog-A;
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
CBRAMs (Conductive Bridging Random Access Memory) are a kind of Resistive Random Access Memories (RRAMs) fabricated in the BEOL (Back-End-Of-Line). They are a promising breakthrough for including permanent retention mechanisms (non-volatility) in embedded systems at low cost. Thus, they are becoming very interesting for the designers community as well. To use this device to design innovative circuits, a compact model is mandatory. In this paper, we propose a continuous physical compact model, written in Verilog-A. Main advantage of this approach is its robustness compared to macromodel approach. Moreover, our approach provides more flexibility compared to a behavioural model for adding multilevel aspect. The model is calibrated with the characterization results and integrated in Cadence design flow using Eldo simulator.
引用
收藏
页码:94 / 97
页数:4
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