Single-event effects in resolver-to-digital converters

被引：15

作者：

Buchner, S ^{[1
]}

Tran, L

Mann, J

Turflinger, T

McMorrow, D

Campbell, A

Dozier, C

机构：

[1] USN, Res Lab, Washington, DC 20375 USA

[2] SFA Inc, Largo, MD 20774 USA

[3] NSWC, Crane, IN 47401 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1999年 / 46卷 / 06期

关键词：

D O I：

10.1109/23.819106

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Single-event effects (SEE's) in two resolver-to-digital converters (RDC's) have been studied using heavy ions and pulsed laser light. The important role of the pulsed laser in establishing single-event upset (SEU) and single-event latchup (SEL) levels prior to accelerator testing is described, as is its role in evaluating the test software and hardware and in gaining a better understanding of the origins of the SEE's. Results from pulsed-laser testing are in quantitative agreement with those from heavy-ion testing: the RDC-19220 is sensitive to both SEU's and SEL's whereas the AD2S80 is less sensitive to SEU's and immune to SEL.

引用

页码：1445 / 1452

页数：8

共 50 条

[31] A Method of Resolver-to-Digital Conversion Based on Square Wave Excitation
Shi, Tingna
Hao, Yajing
Jiang, Guokai
Wang, Zhiqiang
Xia, Changliang
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2018, 65 (09) : 7211 - 7219
[32] Software-Based Resolver-to-Digital Converter Using an α-β-γ Filter
Zou, Jiming
Zhu, Pengcheng
Zhang, Wentao
Xu, Yongxiang
Zou, Jibin
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2024, 73 : 1 - 11
[33] A new high accuracy software based resolver-to-digital converter
Di Tommaso, AO
Miceli, R
IECON'03: THE 29TH ANNUAL CONFERENCE OF THE IEEE INDUSTRIAL ELECTRONICS SOCIETY, VOLS 1 - 3, PROCEEDINGS, 2003, : 2435 - 2440
[34] Angle Tracking Observer with Improved Accuracy for Resolver-to-Digital Conversion
Qin, Haoye
Wu, Zhong
SYMMETRY-BASEL, 2019, 11 (11):
[35] Total-dose and single-event effects in switching DC/DC power converters
Adell, PC
Schrimpf, RD
Choi, BK
Holman, WT
Attwood, JP
Cirba, CR
Galloway, KF
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2002, 49 (06) : 3217 - 3221
[36] Software-based resolver-to-digital conversion using a DSP
Sarma, Santanu
Agrawal, V. K.
Udupa, Subramanya
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2008, 55 (01) : 371 - 379
[37] Design of Synchro Resolver-to-digital Converter Based on PXI Bus
Zhang Haixia
Yanlan
2009 PACIFIC-ASIA CONFERENCE ON KNOWLEDGE ENGINEERING AND SOFTWARE ENGINEERING, PROCEEDINGS, 2009, : 194 - +
[38] A DSP-Based Resolver-to-Digital Conversion Using Pulse Excitation
Hou, Chung-Chuan
2012 IEEE ENERGY CONVERSION CONGRESS AND EXPOSITION (ECCE), 2012, : 503 - 508
[39] Single-event upset effects in optocouplers
Johnston, AH
Swift, GM
Miyahira, T
Guertin, S
Edmonds, LD
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1998, 45 (06) : 2867 - 2875
[40] Compendium of Single-Event Latchup and Total Ionizing Dose Test Results of Commercial Analog to Digital Converters
Irom, Farokh
Agarwal, Shri G.
2012 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW), 2012,

← 1 2 3 4 5 →