Single-event effects in resolver-to-digital converters

被引：15

作者：

Buchner, S ^{[1
]}

Tran, L

Mann, J

Turflinger, T

McMorrow, D

Campbell, A

Dozier, C

机构：

[1] USN, Res Lab, Washington, DC 20375 USA

[2] SFA Inc, Largo, MD 20774 USA

[3] NSWC, Crane, IN 47401 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1999年 / 46卷 / 06期

关键词：

D O I：

10.1109/23.819106

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Single-event effects (SEE's) in two resolver-to-digital converters (RDC's) have been studied using heavy ions and pulsed laser light. The important role of the pulsed laser in establishing single-event upset (SEU) and single-event latchup (SEL) levels prior to accelerator testing is described, as is its role in evaluating the test software and hardware and in gaining a better understanding of the origins of the SEE's. Results from pulsed-laser testing are in quantitative agreement with those from heavy-ion testing: the RDC-19220 is sensitive to both SEU's and SEL's whereas the AD2S80 is less sensitive to SEU's and immune to SEL.

引用

页码：1445 / 1452

页数：8

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