Al2O3 Coatings Fabrication on Silver Nanowires through Low Temperature Atomic Layer Deposition

被引:11
|
作者
Ali, Kamran [1 ]
Duraisamy, Navaneethan [1 ]
Kim, Chang Young [2 ,3 ]
Choi, Kyung-Hyun [1 ]
机构
[1] Jeju Natl Univ, Dept Mechatron Engn, Cheju 690756, South Korea
[2] Jeju Natl Univ, Res Inst Basic Sci, Cheju 690756, South Korea
[3] Jeju Natl Univ, Dept Phys, Cheju 690756, South Korea
关键词
Al2O3; Deposition; Silver; XPS; XRD; THIN-FILMS; ALUMINUM; GROWTH;
D O I
10.1080/10426914.2014.930959
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Silver nanowires (AgNWs) films were coated conformally with aluminum oxide (Al2O3) through atomic layer deposition (ALD) at very low temperature. The AgNWs films were first fabricated through spin coating on polyamide substrates. Later on Al2O3 coatings were deposited on the spin coated AgNWs films by ALD at a very low deposition temperature of 50 degrees C using trimethylaluminum and distilled water. The optimized ALD cycle involves a very short H2O purging step of only 10 s, which not only removes the residual H2O vapors effectively but also enhances the efficeny of the process by reducing the total time required for completion of Al2O3 deposition. The surface morphology was observed through field-emission scanning electron microscopy and film crystallinity using X-ray diffractometer, respectively. The observed results revealed conformal and amorphous nature of Al2O3 coatings on AgNWs films. The chemical composition and films purity were analyzed by X-ray photoelectron spectroscopy. It has been verified by the results that the ALD technique is well capable of depositing uniform Al2O3 coatings on AgNWs films at very low temperature. The deposited coatings are expected to be of very much interest in flexible electronic applications in near future.
引用
收藏
页码:1056 / 1061
页数:6
相关论文
共 50 条
  • [21] Nucleation and growth during the atomic layer deposition of W on Al2O3 and Al2O3 on W
    Grubbs, RK
    Nelson, CE
    Steinmetz, NJ
    George, SM
    THIN SOLID FILMS, 2004, 467 (1-2) : 16 - 27
  • [22] Protection of polymer from atomic-oxygen erosion using Al2O3 atomic layer deposition coatings
    Cooper, Russell
    Upadhyaya, Hari P.
    Minton, Timothy K.
    Berman, Michael R.
    Du, Xiaohua
    George, Steven M.
    THIN SOLID FILMS, 2008, 516 (12) : 4036 - 4039
  • [23] Fabrication of Microholographic Gratings on Al2O3 Grown by Atomic Layer Deposition Using a Femtosecond Laser
    Bang, Le Thanh
    Fauzi, Anas
    Heo, Kwan-Jun
    Kim, Sung-Jin
    Kim, Nam
    JOURNAL OF THE OPTICAL SOCIETY OF KOREA, 2014, 18 (06) : 685 - 690
  • [24] Fabrication and magnetic properties of FePt/Al2O3 composite film by atomic-layer-deposition
    Kong, Ji-Zhou
    Gao, Mo-Yun
    Zhai, Hai-Fa
    Yan, Qing-Yu
    Li, Ai-Dong
    Li, Hui
    Wu, Di
    JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2013, 343 : 1 - 5
  • [25] Morphology of Al2O3 Film Fabricated by Atomic Layer Deposition
    Wang Chenying
    Yang Shuming
    Li Changsheng
    Jing Weixuan
    Lin Qijing
    Jiang Zhuangde
    Zhang Yijun
    RARE METAL MATERIALS AND ENGINEERING, 2015, 44 (12) : 3078 - 3082
  • [26] Atomic layer deposition of Al2O3 thin films on diamond
    Kawakami, N
    Yokota, Y
    Tachibana, T
    Hayashi, K
    Kobashi, K
    DIAMOND AND RELATED MATERIALS, 2005, 14 (11-12) : 2015 - 2018
  • [27] Effect of precursor concentration in atomic layer deposition of Al2O3
    Kuse, R
    Kundu, M
    Yasuda, T
    Miyata, N
    Toriumi, A
    JOURNAL OF APPLIED PHYSICS, 2003, 94 (10) : 6411 - 6416
  • [28] Epitaxy of copper on α-Al2O3(001) by atomic layer deposition
    Törndahl, T
    Lu, J
    Ottosson, M
    Carlsson, JO
    JOURNAL OF CRYSTAL GROWTH, 2005, 276 (1-2) : 102 - 110
  • [29] Plasma enhanced atomic layer deposition of Al2O3 and TiN
    Choi, SW
    Jang, CM
    Kim, DY
    Ha, JS
    Park, HS
    Koh, W
    Lee, CS
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2003, 42 : S975 - S979
  • [30] Effect of process pressure on atomic layer deposition of Al2O3
    Li, Ming-Yen
    Chang, Yung-Yuan
    Wu, Hsiao-Che
    Huang, Cheng-Sung
    Chen, Jen-Chung
    Lue, Jen-Lang
    Chang, Shieh-Ming
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2007, 154 (11) : H967 - H972