X-ray determination of the thermal expansion of TiN, TiC and Ti(N,C) crystals

被引：0

作者：

Wokulska, K

机构：

来源：

SOLID STATE CRYSTALS IN OPTOELECTRONICS AND SEMICONDUCTOR TECHNOLOGY | 1997年 / 3179卷

关键词：

thermal expansion; TiN; TiC and solid solution; lattice parameters;

D O I：

10.1117/12.276221

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

Precise lattice parameters of stoichiometric TiN, TIC and Ti(N,C) solid solutions whiskers and needle-like crystals have been determined using the Bond's method Temperature measurement of lattice parameters in the range 290 - 600 K have been performed and thermal expansion coefficients ct have been determined A non-linear change of coefficients cc, with the composition has been found The observed decrease of a values for solid solutions crystals was related to the character of chemical bonds.

引用

页码：176 / 179

页数：4

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