X-ray determination of the thermal expansion of TiN, TiC and Ti(N,C) crystals

被引：0
|
作者：
Wokulska, K
机构：
来源：
SOLID STATE CRYSTALS IN OPTOELECTRONICS AND SEMICONDUCTOR TECHNOLOGY | 1997年 / 3179卷
关键词：
thermal expansion; TiN; TiC and solid solution; lattice parameters;
D O I：
10.1117/12.276221
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
Precise lattice parameters of stoichiometric TiN, TIC and Ti(N,C) solid solutions whiskers and needle-like crystals have been determined using the Bond's method Temperature measurement of lattice parameters in the range 290 - 600 K have been performed and thermal expansion coefficients ct have been determined A non-linear change of coefficients cc, with the composition has been found The observed decrease of a values for solid solutions crystals was related to the character of chemical bonds.
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页码：176 / 179
页数：4
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