Evidence for deep recombination centers in high-purity silicon from photoluminescence measurements at elevated temperatures

被引:0
|
作者
Alex, V [1 ]
Weber, J [1 ]
机构
[1] Max Planck Inst Festkorperforsch, D-70506 Stuttgart, Germany
关键词
silicon; recombination center; photoluminescence;
D O I
10.1016/S0921-4526(99)00482-2
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Photoluminescence spectra of high-purity crystalline silicon samples are measured for temperatures up to 1000 K. The room-temperature lifetime of the near-edge-photoluminescence is in agreement with a coulomb-enhanced radiative decay of free excitons. However, the increase in lifetime with temperature asks for a Shockley-Read-Hall recombination process, which involves a deep-defect of unknown origin. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:375 / 378
页数:4
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