Threshold energy of neutron-induced single event upset as a critical factor

被引：13
|
作者：
Yahagi, Y
Ibe, E
Takahashi, Y
Saito, Y
Eto, A
Sato, M
Kameyama, H
Hidaka, M
Terunuma, K
Nunomiya, T
Nakamura, T
机构：
来源：
2004 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS | 2004年
关键词：
D O I：
10.1109/RELPHY.2004.1315443
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：669 / 670
页数：2
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