The current-voltage and capacitance-voltage characteristics at high temperatures of Au Schottky contact to n-type GaAs

被引:29
|
作者
Ozerli, Halil [1 ]
Karteri, Ibrahim [1 ]
Karatas, Sukru [1 ,2 ]
Altindal, Semsettin [3 ]
机构
[1] Kahramanmaras Sutcu Imam Univ, Fac Sci & Arts, Dept Phys, Dept Mat Sci & Engn, TR-46100 Kahramanmaras, Turkey
[2] Gazi Univ, Fac Sci, Dept Phys, TR-06100 Ankara, Turkey
[3] Gazi Univ, Dept Phys, TR-06100 Ankara, Turkey
关键词
Electronic materials; Semiconductors; Crystal growth; Semiconductivity; Electrical properties; Electronic structure; METAL-SEMICONDUCTOR INTERFACES; DEPENDENT CURRENT-VOLTAGE; I-V-T; BARRIER-HEIGHT; ELECTRICAL CHARACTERISTICS; DENSITY DISTRIBUTION; CURRENT TRANSPORT; STATE DENSITY; DIODES; SI;
D O I
10.1016/j.materresbull.2014.02.011
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have investigated the temperature-dependent current voltage (I-V) and capacitance-voltage (C-V) characteristics of Au/n-GaAs Schottky barrier diodes (SBDs) in the temperature range of 280-415 K. The barrier height for the Au/n-type GaAs SBDs from the I-V and C-V characteristics have varied from 0.901 eV to 0.963 eV (I-V) and 1.234 eV to 0.967 eV (C-V), and the ideality factor (n) from 1.45 to 1.69 in the temperature range 280-415 K. The conventional Richardson plots are found to be linear in the temperature range measured. Both the ln(Io/T-2) versus (kT)(-1) and ln(Io/T-2) versus (nkT)(-1) plots gives a straight line corresponding to activation energies 0.773 eV and 0.870 eV, respectively,A Phi(b0) versus 1/T plot was drawn to obtain evidence of a Gaussian distribution of the BHs, and values of Phi(b0) = 1.071 eV and sigma(0) = 0.094 V for the mean BH and zero-bias standard deviation have been obtained from this plot. (C) 2014 Elsevier Ltd. All rights reserved.
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页码:211 / 217
页数:7
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