The current-voltage and capacitance-voltage characteristics at high temperatures of Au Schottky contact to n-type GaAs

被引:29
|
作者
Ozerli, Halil [1 ]
Karteri, Ibrahim [1 ]
Karatas, Sukru [1 ,2 ]
Altindal, Semsettin [3 ]
机构
[1] Kahramanmaras Sutcu Imam Univ, Fac Sci & Arts, Dept Phys, Dept Mat Sci & Engn, TR-46100 Kahramanmaras, Turkey
[2] Gazi Univ, Fac Sci, Dept Phys, TR-06100 Ankara, Turkey
[3] Gazi Univ, Dept Phys, TR-06100 Ankara, Turkey
关键词
Electronic materials; Semiconductors; Crystal growth; Semiconductivity; Electrical properties; Electronic structure; METAL-SEMICONDUCTOR INTERFACES; DEPENDENT CURRENT-VOLTAGE; I-V-T; BARRIER-HEIGHT; ELECTRICAL CHARACTERISTICS; DENSITY DISTRIBUTION; CURRENT TRANSPORT; STATE DENSITY; DIODES; SI;
D O I
10.1016/j.materresbull.2014.02.011
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have investigated the temperature-dependent current voltage (I-V) and capacitance-voltage (C-V) characteristics of Au/n-GaAs Schottky barrier diodes (SBDs) in the temperature range of 280-415 K. The barrier height for the Au/n-type GaAs SBDs from the I-V and C-V characteristics have varied from 0.901 eV to 0.963 eV (I-V) and 1.234 eV to 0.967 eV (C-V), and the ideality factor (n) from 1.45 to 1.69 in the temperature range 280-415 K. The conventional Richardson plots are found to be linear in the temperature range measured. Both the ln(Io/T-2) versus (kT)(-1) and ln(Io/T-2) versus (nkT)(-1) plots gives a straight line corresponding to activation energies 0.773 eV and 0.870 eV, respectively,A Phi(b0) versus 1/T plot was drawn to obtain evidence of a Gaussian distribution of the BHs, and values of Phi(b0) = 1.071 eV and sigma(0) = 0.094 V for the mean BH and zero-bias standard deviation have been obtained from this plot. (C) 2014 Elsevier Ltd. All rights reserved.
引用
收藏
页码:211 / 217
页数:7
相关论文
共 50 条
  • [31] Analysis of temperature dependent current-voltage and capacitance-voltage characteristics of an Au/V2O5/n-Si Schottky diode
    Mahato, Somnath
    Biswas, Debaleen
    Gerling, Luis G.
    Voz, Cristobal
    Puigdollers, Joaquim
    AIP ADVANCES, 2017, 7 (08)
  • [33] On current-voltage and capacitance-voltage characteristics of metal-semiconductor contacts
    Turut, Abdulmecit
    TURKISH JOURNAL OF PHYSICS, 2020, 44 (04): : 302 - 347
  • [34] The effects of electron irradiation on the current-voltage and capacitance-voltage measurements of Sn/p-GaAs/Au diodes
    Duman, Songuel
    Kaya, Fikriye Seyma
    Dogan, Huelya
    Turgut, Gueven
    Sahin, Yilmaz
    RADIATION PHYSICS AND CHEMISTRY, 2022, 193
  • [35] CURRENT-VOLTAGE AND CAPACITANCE-VOLTAGE CHARACTERISTICS OF A METAL/AL0.5GA0.5AS/GAAS CAPACITOR
    DRUMMOND, TJ
    FISCHER, R
    ARNOLD, D
    MORKOC, H
    SHUR, MS
    APPLIED PHYSICS LETTERS, 1984, 44 (02) : 214 - 216
  • [36] Temperature dependent current-voltage characteristics of Au/n-type Ge Schottky barrier diodes with graphene interlayer
    Khurelbaatar, Zagarzusem
    Kang, Min-Sung
    Shim, Kyu-Hwan
    Yun, Hyung-Joong
    Lee, Jouhan
    Hong, Hyobong
    Chang, Sung-Yong
    Lee, Sung-Nam
    Choi, Chel-Jong
    JOURNAL OF ALLOYS AND COMPOUNDS, 2015, 650 : 658 - 663
  • [37] Analysis of the current-voltage characteristics of the Pd/Au Schottky structure on n-type GaN in a wide temperature range
    Ravinandan, M.
    Rao, P. Koteswara
    Reddy, V. Rajagopal
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2009, 24 (03)
  • [38] Temperature dependent current-voltage characteristics of Au/n-type Ge Schottky barrier diodes with graphene interlayer
    Khurelbaatar, Zagarzusem
    Kang, Min-Sung
    Shim, Kyu-Hwan
    Yun, Hyung-Joong
    Lee, Jouhan
    Hong, Hyobong
    Chang, Sung-Yong
    Lee, Sung-Nam
    Choi, Chel-Jong
    Journal of Alloys and Compounds, 2015, 650 : 658 - 663
  • [39] Temperature dependence of current-voltage characteristics of Au/n-GaAs epitaxial Schottky diode
    Singh, R
    Arora, SK
    Tyagi, R
    Agarwal, SK
    Kanjilal, D
    BULLETIN OF MATERIALS SCIENCE, 2000, 23 (06) : 471 - 474
  • [40] Reverse bias capacitance-voltage characteristics of Au/n-GaAs Schottky diodes under hydrostatic pressure
    Çankaya, G
    Uçar, N
    Türüt, A
    INTERNATIONAL JOURNAL OF ELECTRONICS, 2000, 87 (10) : 1171 - 1176