A Low-Cost Output Response Analyzer Circuit for ADC BIST

被引：0

作者：

Ting, Hsin-Wen ^{[1
]}

Chao, I-Jen ^{[1
]}

Lien, Yu-Chang ^{[1
]}

Chang, Soon-Jyh ^{[1
]}

Liu, Bin-Da ^{[1
]}

机构：

[1] Natl Cheng Kung Univ, Dept Elect Engn, Tainan 70101, Taiwan

来源：

IEEE CIRCUITS AND SYSTEMS INTERNATIONAL CONFERENCE ON TESTING AND DIAGNOSIS | 2009年

关键词：

analog-to-digital converter; sine-wave histogram test; COordinate rotation digital computer technique;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, a low-cost ADC output response analyzer (ORA) circuit for built-in self-test (BIST) application is proposed. The sine-wave histogram testing method and the basic COordinate Rotation Digital Computer (CORDIC) technique are used to design the proposed ADC ORA circuit. The ADC's static and dynamic parameters can both be obtained using the proposed circuit. The basic CORDIC based ADC ORA circuit is designed and synthesized in a 0.18-mu m technology to analyze the outputs an 8-bit ADC to verify the designs. It shows a lower area overhead compared with the Fast Fourier transform (FFT) based realization.

引用

页码：371 / 374

页数：4

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